X-Ray Diffractometer (XRD Instruments)

X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.

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CompanyRigaku CorporationRigaku CorporationRigaku CorporationRigaku CorporationRigaku Corporation
ItemMiniFlex Benchtop X-ray DiffractometerAutoMATE IIMiniflex XpC XRDXtaLAB mini™ II Benchtop X-ray Diffraction/Crystallography SystemXtaLAB Synergy-DW Versatile Dual Wavelength XRD with HPC X-ray Detector
Citations
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Catalog NumberMiniFlexAutoMATE IIMiniFlex XpCXtaLAB mini IIXtaLAB Synergy-DW
Price
X-Ray TubeInquireCr (Maximum load 2 kW), Effective focus size 1 × 10 mm2 (N.F.), Short type600 Wstandard X-ray tubesInquire
X-Ray GeneratorCu, Co, Fe, or Cr, 40 kV, 15 mA3 kW sealed X-ray tubeCompact 800 W generator and compact X-ray tubeStandard sealed tube X-ray source running at 600 W coupled to a special curved monochromator to produce usable X-ray flux comparable to a standard X-ray diffractometerDual wavelength X-ray source
Goniometer TypeVertical, Theta or 2Thetatwo-axis goniometerΘ-Θ sample horizontal goniometerRugged two-axis goniometer with fixed detectorkappa goniometer
Detector(s)D/teX, Ultra 1D High speed silicon strip detectorD/teX Ultra 1000D/teX Ultra silicon stripHyPix-Bantam two-dimensional semiconductor X-ray detectorHPC detector
DescriptionNew sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is ... Read MoreThe AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.

The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and
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The Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing ... Read MoreBenchtop small molecule structure determination

The Rigaku XtaLAB mini II benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II
... Read More
One source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide... Read More
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