| Description | New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview: - New 6th generation design
- Compact, fail-safe radiation enclosure
- Incident beam variable slit
- Simple installation and user training
- Factory aligned goniometer system
- Laptop computer operation
Measurements: - Phase identification
- Phase quantification
- Percent (%) crystallinity
- Crystallite size and strain
- Lattice parameter refinement
- Rietveld refinement
- Molecular structure
Options: - 8-position autosampler
- Graphite monochromator
- D/teX Ultra: silicon strip detector
- HyPix-400 MF: 2D HPAD detector
- Air sensitive sample holder
- Travel case
... Read More | The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and perform scans with minimum steps of 0.1 microns when using the automated XYZ stage.
Features: - Highly accurate goniometer allows for true micro-area residual stress measurement.
- Automatic mapping measurements with teaching function.
- An X-ray radiation enclosure with interlock system automatically locks the enclosure door when the X-ray shutter is open.
- The measurement position is adjusted by _x000B_a CCD camera equipped with a microscope having a zoom function.
- The two-axis goniometer system allows for both iso-inclination _x000B_and side-inclination methods automatically without readjustment of the sample position.
... Read More | Benchtop small molecule structure determination
The Rigaku XtaLAB mini II benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II Benchtop small molecule structure determination
The Rigaku XtaLAB mini II benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II will enhance research productivity by offering affordable structure analysis capability without the necessity of relying on a departmental facility. With the XtaLAB mini II, you no longer have to wait in line to determine your structures. Instead your research group can rapidly analyze new compounds as they are synthesized in the lab.
Teach diffraction through hands-on experience -
In many universities, the departmental X-ray diffractometer is considered off limits to students because of fear that the instrument might be damaged by inexperienced users. The XtaLAB mini II provides the opportunity for students to learn single crystal analysis by actually using a diffractometer. This is not a black box instrument. Rather, the important step of mounting a crystal on the goniometer and physically centering the crystal in the position of the X-ray beam, ensures that students learn the importance of mounting techniques and crystal selection. The simple design of the XtaLAB mini II minimizes the danger of students damaging the system.
Reduced size does not mean reduced data quality -
The Rigaku XtaLAB mini II is a research grade chemical crystallography instrument that sits on the benchtop. No data quality compromises, no extended collection times. Results delivered are unambiguous. X-ray tube lifetime is extended by running at 600 W. To compensate for running at a lower power, a SHINE optic (special curved monochromator) is utilized to produce usable X-ray flux comparable to a standard X-ray system.
Dedicated to producing publication quality structures -
The chief design requirement when creating the XtaLAB mini II was that the structures produced would be publishable in the most demanding scientific journals. The HPC detector is positioned so that the maximum 2θ value is well outside of the Acta Cryst. requirements. The software provides all the tools you need to generate publication quality data that can be used to determine 3D structures from a variety of structure analysis packages.
Features: - Affordable design with low operating costs
- Requires minimal training and support
- Automatic structure solution software
- Provides definitive structural information
- Ideal supplement for a NMR spectrometer
- Perfect self-serve departmental lab instrument
- Ideal teaching instrument
- Publication quality results
- Air-cooled HPC detector
- No special infrastructure required (110 VAC)
- Optional cryosystem available
... Read More | The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and nanocrcrystals as small as tens of nanometers, opening up many new possibilities. This new capability allows you to go beyond the limitations of X-ray diffraction (XRD), which requires samples greater them 1 µm.
- Directly determine 3D molecular structures of submicron crystals for the first time
- Rigaku’s high-speed, high-sensitivity photon counting detector - HyPix-ED
- JEOL’s expertise in generation and control of stable electron beams – 200 kV electron source and optics
- Rigaku’s powerful single crystal analysis software – CrysAlisPro-ED
3DED/microED is an excellent complementary technique to XRD, and the compact design of the XtaLAB Synergy-ED allows it to be easily located in laboratories alongside these instruments. Crystallographers familiar with Rigaku diffractometers running CrysAlisPRO will be able to adapt to the CrysAlisPRO-ED interface very quickly, as it is based on the same intuitive platform.
The fully integrated system incorporates a seamless workflow from data collection to structure determination of three-dimensional molecular structures. AutoChem, which is fully integrated into CrysAlisPRO, performs fast, fully automated structure solution and refinement during data collection, optimizing your productivity.
3DED/microED allows direct structural determination of sub-micron sized crystals that could only previously be postulated by techniques such as NMR. As an emerging technique, there is scope for the generation of many publications using the XtaLAB Synergy-ED.
... Read More | With your success utmost in our minds, we have developed the XtaLAB Synergy-S X-ray diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy-S produces With your success utmost in our minds, we have developed the XtaLAB Synergy-S X-ray diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy-S produces fast, precise data in an intelligent fashion.
The system is based around the PhotonJet-S series of microfocus X-ray sources that incorporate continuously variable divergence slits. These third generation sources have been designed to maximize X-ray photons at the sample by using a combination of new optics, new, longer life, tubes and an improved alignment system. PhotonJets are available in Cu, Mo or Ag wavelengths in either a single or dual source configuration.
The XtaLAB Synergy-S single crystal X-ray diffractometer comes with kappa goniometer that incorporates fast motor speeds and a unique telescopic two-theta arm to provide total flexibility for your diffraction experiment. The system is also equipped with your choice of HPC X-ray detector, including the HyPix-6000HE, PILATUS3 R 200K, PILATUS3 R 300K or EIGER 1M.
Features: - Thigh source flux and increased goniometer speed to allow quicker, more agile experiments
- Unique telescopic two-theta arm to reach both longer and shorter crystal-to-detector distances
- Enhanced kappa goniometer design with symmetrical 2? positioning
- Improved X-ray optic alignment mechanism for easy maintenance
- User-inspired cabinet design for improved workflow
- New electronically controlled brightness of cabinet and crystal lighting
- Extremely high performance due to bright source, noise-free X-ray detector and fast goniometer speeds
- Continuously variable divergence slits lets you resolve reflections from long unit cells
- Minimal downtime with longer X-ray tube lifetime - supported by online diagnostics and troubleshooting
- Compact design to fit in your laboratory
... Read More |