X-Ray Diffractometer (XRD Instruments)

X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.

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CompanyRigaku CorporationRigaku CorporationRigaku CorporationRigaku CorporationRigaku Corporation
ItemMiniFlex Benchtop X-ray DiffractometerDicifferX WAXS EditionXtaLAB Synergy-DW Versatile Dual Wavelength XRD with HPC X-ray DetectorXtaLAB Synergy-ED Electron DiffractometerXtaLAB Synergy-S Single or Dual Microfocus X-ray Diffractometer
Citations
Catalog NumberMiniFlexXtaLAB Synergy-DWXtaLAB Synergy-EDXtaLAB Synergy-S
Price
X-Ray TubeInquireInquireInquireInquireInquire
X-Ray GeneratorCu, Co, Fe, or Cr, 40 kV, 15 mAHigh-brilliance rotating anode with multilayer focusing mirror (10^9 cps at 200 µm beam)Dual wavelength X-ray sourceInquireInquire
Goniometer TypeVertical, Theta or 2ThetaNo goniometer (open stage design)kappa goniometerSingle rotation axisInquire
Detector(s)D/teX, Ultra 1D High speed silicon strip detectorHyPix-6000 2D HPAD on motorized 2-axis stageHPC detectorHigh-speed, high-sensitivity photon-counting detector, HyPix-EDInquire
DescriptionNew sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is ... Read MoreInquireOne source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide... Read MoreThe XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and ... Read MoreWith your success utmost in our minds, we have developed the XtaLAB Synergy-S X-ray diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy-S produces ... Read More
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