X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | MiniFlex Benchtop X-ray Diffractometer | Rigaku XtaLAB Synergy Flow Automated Single Crystal XRD | XtaLAB Synergy-DW Versatile Dual Wavelength XRD with HPC X-ray Detector | XtaLAB Synergy-i Single Crystal X-ray Diffractometer | XtaLAB Synergy-R High-flux Rotating Anode X-ray Diffractometer |
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| Catalog Number | MiniFlex | | XtaLAB Synergy-DW | XtaLAB Synergy-i | XtaLAB Synergy-R |
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| X-Ray Tube | Inquire | Inquire | Inquire | Inquire | Inquire |
| X-Ray Generator | Cu, Co, Fe, or Cr, 40 kV, 15 mA | Inquire | Dual wavelength X-ray source | Inquire | Inquire |
| Goniometer Type | Vertical, Theta or 2Theta | Intelligent Goniometer Head (IGH) with motorized automation; automated sample centering in as little as 6 seconds | kappa goniometer | Inquire | Inquire |
| Detector(s) | D/teX, Ultra 1D High speed silicon strip detector | Direct X-ray detection detectors (varies by Synergy base model selected) | HPC detector | HyPix-Bantam | Inquire |
| Description | New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview: - New 6th generation design
- Compact, fail-safe radiation enclosure
- Incident beam variable slit
- Simple installation and user training
- Factory aligned goniometer system
- Laptop computer operation
Measurements: - Phase identification
- Phase quantification
- Percent (%) crystallinity
- Crystallite size and strain
- Lattice parameter refinement
- Rietveld refinement
- Molecular structure
Options: - 8-position autosampler
- Graphite monochromator
- D/teX Ultra: silicon strip detector
- HyPix-400 MF: 2D HPAD detector
- Air sensitive sample holder
- Travel case
... Read More | Inquire | One source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wideOne source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide range of research interests.
The XtaLAB Synergy-DW diffractometer is based on the proven, low-maintenance MicroMax-007 HF microfocus rotating anode. The target is constructed with two different X-ray source materials (Cu and Mo) and is coupled with an auto-switching dual wavelength optic. Copper or molybdenum X-ray radiation is available at the click of a button. The XtaLAB Synergy-DW offers up to 12x higher flux compared to the standard sealed tube X-ray sources and, utilizing only one generator, means overall maintenance is reduced.
Rounding out the XtaLAB Synergy-DW configuration is the fast and efficient four-circle kappa goniometer which is compatible with a wide range of detectors including the HyPix-6000HE and other Hybrid Photon Counting (HPC) X-ray detectors e.g. PILATUS and EIGER detectors.
Features: - TAccess to two wavelengths in one compact system
- 12x higher flux than sealed tube X-ray sources
- Low maintenance, high performance system
- Uses CrysAlisPro software with both PX and SMX modes
- Multi-functional diffractometer to cover you wherever your research takes you
- High flux performance means you all your crystallography needs can be carried out ‘in-house’
- Very little downtime and easy maintenance
- No need to purchase extra software for different applications
... Read More | The XtaLAB Synergy-i single crystal X-ray diffractometer includes a high-flux, low maintenance microfocus sealed tube X-ray instrument with a high precision 4-circle kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector known as the HyPix-Bantam. The XtaLAB Synergy-i containsThe XtaLAB Synergy-i single crystal X-ray diffractometer includes a high-flux, low maintenance microfocus sealed tube X-ray instrument with a high precision 4-circle kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector known as the HyPix-Bantam. The XtaLAB Synergy-i contains the latest technology and can be upgraded from a single source to a dual source instrument. The system can be equipped with Cu and/or Mo sources allowing for a broad range of sample types to be evaluated. The XtaLAB Synergy-i is controlled by the fully-integrated, user-inspired CrysAlisPro software package that is capable of collecting and processing data efficiently and accurately, so you achieve the best data possible.
The XtaLAB Synergy-i is a full-featured single crystal X-ray diffractometer that requires little servicing to maximize uptime and throughput. It is the ideal diffractometer for crystallography research laboratories.
Features: - Up to 50 W microfocus X-ray tube with multilayer optics
- High precision 4-circle kappa goniometer
- State-of-the-art HPC technology detector, the HyPix-Bantam
- New cabinet design with controlled sample and cabinet lighting
- The system conforms to the most stringent of X-ray safety guidelines
- CrysAlisPro: Powerful, user-friendly software, comes standard with AutoChem3.0 for fully-automated structure solution and refinement
- Simple dual-source upgrade
... Read More | The XtaLAB Synergy-R is the most powerful small molecule diffractometer available. It includes a high-flux, low-maintenance microfocus rotating anode, the PhotonJet-R, with a high-precision kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector the HyPix-6000HE. The PhotonJet-The XtaLAB Synergy-R is the most powerful small molecule diffractometer available. It includes a high-flux, low-maintenance microfocus rotating anode, the PhotonJet-R, with a high-precision kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector the HyPix-6000HE. The PhotonJet-R X-ray source is comprised of a Micromax-007 HF rotating anode and a newly designed optic. It is available with either Cu or Mo anodes.
This single crystal X-ray diffractometer has been specially designed to fully integrate the rotating anode X-ray source with all system components and software making it a sleek, simple to use diffractometer without compromising the X-ray intensity.
For labs with high-throughput requirements, increasing the flux reduces data collection time and thus increases the number of samples that can be studied in your laboratory. For extremely small samples, additional flux will extend the minimum size limits for crystals that you can study.
Features: - True shutterless data collection
- Noise-free HPC X-ray detector for better measurement of weak data
- 4-circle kappa goniometer with high accuracy and speed
- Fast workflow due to complete integration of software and hardware
- Excels at the most challenging applications, e.g. MOFs or incommensurate structures
- Extremely high performance due to bright source, noise-free detector and fast goniometer speeds
- Provides unparalleled throughput
- Compact design to fit in your laboratory
... Read More |
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