X-Ray Diffractometer (XRD Instruments)

X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.

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CompanyRigaku CorporationRigaku CorporationRigaku CorporationRigaku Corporation
ItemMiniFlex Benchtop X-ray DiffractometerDicifferX WAXS Edition High-speed wide-angle X-ray Scattering SystemMiniflex XpC XRDXtaLAB Synergy-S Single or Dual Microfocus X-ray Diffractometer
Citations
Catalog NumberMiniFlexDicifferX WAXSMiniFlex XpCXtaLAB Synergy-S
Price
X-Ray TubeInquire1.2 kW micro source rotating anode X-ray generator600 WInquire
X-Ray GeneratorCu, Co, Fe, or Cr, 40 kV, 15 mAInquireCompact 800 W generator and compact X-ray tubeInquire
Goniometer TypeVertical, Theta or 2ThetaWAXS cameraΘ-Θ sample horizontal goniometerInquire
Detector(s)D/teX, Ultra 1D High speed silicon strip detectorHigh-energy resolution 2D hybrid pixel array detector (HyPix)D/teX Ultra silicon stripInquire
DescriptionNew sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is ... Read MoreBreakthrough speed and versatility for polymer structure analysis
  • Next-generation WAXS system equipped with a high-brilliance X-ray source
  • Structural information captured non-destructively in just a few seconds of exposure
  • Time-resolved in-situ measurements for heating, stretching, and
... Read More
The Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing ... Read MoreWith your success utmost in our minds, we have developed the XtaLAB Synergy-S X-ray diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy-S produces ... Read More
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