| Description | The XtaLAB Synergy-i single crystal X-ray diffractometer includes a high-flux, low maintenance microfocus sealed tube X-ray instrument with a high precision 4-circle kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector known as the HyPix-Bantam. The XtaLAB Synergy-i containsThe XtaLAB Synergy-i single crystal X-ray diffractometer includes a high-flux, low maintenance microfocus sealed tube X-ray instrument with a high precision 4-circle kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector known as the HyPix-Bantam. The XtaLAB Synergy-i contains the latest technology and can be upgraded from a single source to a dual source instrument. The system can be equipped with Cu and/or Mo sources allowing for a broad range of sample types to be evaluated. The XtaLAB Synergy-i is controlled by the fully-integrated, user-inspired CrysAlisPro software package that is capable of collecting and processing data efficiently and accurately, so you achieve the best data possible.
The XtaLAB Synergy-i is a full-featured single crystal X-ray diffractometer that requires little servicing to maximize uptime and throughput. It is the ideal diffractometer for crystallography research laboratories.
Features: - Up to 50 W microfocus X-ray tube with multilayer optics
- High precision 4-circle kappa goniometer
- State-of-the-art HPC technology detector, the HyPix-Bantam
- New cabinet design with controlled sample and cabinet lighting
- The system conforms to the most stringent of X-ray safety guidelines
- CrysAlisPro: Powerful, user-friendly software, comes standard with AutoChem3.0 for fully-automated structure solution and refinement
- Simple dual-source upgrade
... Read More | New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview: - New 6th generation design
- Compact, fail-safe radiation enclosure
- Incident beam variable slit
- Simple installation and user training
- Factory aligned goniometer system
- Laptop computer operation
Measurements: - Phase identification
- Phase quantification
- Percent (%) crystallinity
- Crystallite size and strain
- Lattice parameter refinement
- Rietveld refinement
- Molecular structure
Options: - 8-position autosampler
- Graphite monochromator
- D/teX Ultra: silicon strip detector
- HyPix-400 MF: 2D HPAD detector
- Air sensitive sample holder
- Travel case
... Read More | Inquire | The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and nanocrcrystals as small as tens of nanometers, opening up many new possibilities. This new capability allows you to go beyond the limitations of X-ray diffraction (XRD), which requires samples greater them 1 µm.
- Directly determine 3D molecular structures of submicron crystals for the first time
- Rigaku’s high-speed, high-sensitivity photon counting detector - HyPix-ED
- JEOL’s expertise in generation and control of stable electron beams – 200 kV electron source and optics
- Rigaku’s powerful single crystal analysis software – CrysAlisPro-ED
3DED/microED is an excellent complementary technique to XRD, and the compact design of the XtaLAB Synergy-ED allows it to be easily located in laboratories alongside these instruments. Crystallographers familiar with Rigaku diffractometers running CrysAlisPRO will be able to adapt to the CrysAlisPRO-ED interface very quickly, as it is based on the same intuitive platform.
The fully integrated system incorporates a seamless workflow from data collection to structure determination of three-dimensional molecular structures. AutoChem, which is fully integrated into CrysAlisPRO, performs fast, fully automated structure solution and refinement during data collection, optimizing your productivity.
3DED/microED allows direct structural determination of sub-micron sized crystals that could only previously be postulated by techniques such as NMR. As an emerging technique, there is scope for the generation of many publications using the XtaLAB Synergy-ED.
... Read More | The XtaLAB Synergy-R is the most powerful small molecule diffractometer available. It includes a high-flux, low-maintenance microfocus rotating anode, the PhotonJet-R, with a high-precision kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector the HyPix-6000HE. The PhotonJet-The XtaLAB Synergy-R is the most powerful small molecule diffractometer available. It includes a high-flux, low-maintenance microfocus rotating anode, the PhotonJet-R, with a high-precision kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector the HyPix-6000HE. The PhotonJet-R X-ray source is comprised of a Micromax-007 HF rotating anode and a newly designed optic. It is available with either Cu or Mo anodes.
This single crystal X-ray diffractometer has been specially designed to fully integrate the rotating anode X-ray source with all system components and software making it a sleek, simple to use diffractometer without compromising the X-ray intensity.
For labs with high-throughput requirements, increasing the flux reduces data collection time and thus increases the number of samples that can be studied in your laboratory. For extremely small samples, additional flux will extend the minimum size limits for crystals that you can study.
Features: - True shutterless data collection
- Noise-free HPC X-ray detector for better measurement of weak data
- 4-circle kappa goniometer with high accuracy and speed
- Fast workflow due to complete integration of software and hardware
- Excels at the most challenging applications, e.g. MOFs or incommensurate structures
- Extremely high performance due to bright source, noise-free detector and fast goniometer speeds
- Provides unparalleled throughput
- Compact design to fit in your laboratory
... Read More |