X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | AutoMATE II | Miniflex XpC XRD | XtaLAB Synergy-ED Electron Diffractometer | XtaLAB Synergy-i Single Crystal X-ray Diffractometer |
| Catalog Number | AutoMATE II | MiniFlex XpC | XtaLAB Synergy-ED | XtaLAB Synergy-i |
| Price | | | | |
| X-Ray Tube | Cr (Maximum load 2 kW), Effective focus size 1 × 10 mm2 (N.F.), Short type | 600 W | Inquire | Inquire |
| X-Ray Generator | 3 kW sealed X-ray tube | Compact 800 W generator and compact X-ray tube | Inquire | Inquire |
| Goniometer Type | two-axis goniometer | Θ-Θ sample horizontal goniometer | Single rotation axis | Inquire |
| Detector(s) | D/teX Ultra 1000 | D/teX Ultra silicon strip | High-speed, high-sensitivity photon-counting detector, HyPix-ED | HyPix-Bantam |
| Description | The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and perform scans with minimum steps of 0.1 microns when using the automated XYZ stage.
Features: - Highly accurate goniometer allows for true micro-area residual stress measurement.
- Automatic mapping measurements with teaching function.
- An X-ray radiation enclosure with interlock system automatically locks the enclosure door when the X-ray shutter is open.
- The measurement position is adjusted by _x000B_a CCD camera equipped with a microscope having a zoom function.
- The two-axis goniometer system allows for both iso-inclination _x000B_and side-inclination methods automatically without readjustment of the sample position.
... Read More | The Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing The Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing floor.
With this in mind, the MiniFlex XpC allows you to process more samples faster, and to gain greater control over your process to ensure consistent quality of your final product. The system is characterized by streamlined operation, rapid analysis with pass/fail evaluation and the ability to automate and integrate with other complementary analytical instruments. The MiniFlex XpC offers the performance level of much larger systems, in the world’s smallest footprint for an online XRD.
Features:
Analytical speed and accuracy are paramount in industrial operations. These factors have been addressed in the design of the MiniFlex XpC by using: - A newly design compact, 800 W high-flux X-ray source and power supply
- World’s largest area/high-throughput 1D detector, enabling higher-intensity data collection
- Optimized θ / θ sample geometry that maintains a horizontal sample orientation
- Streamlined user interface
- Compatibility with sample loading robots or conveyors
- Compact design that can easily be incorporated into existing operations
- A recently patented variable-width scattering slit minimizing background at lower angles
- Sample spinner that negates the effects of preferred orientation
- Uses industry standard steel ring sample holders
Streamlined Operation
In addition to sample loading automation, Rigaku has introduced EasyX, a simplified user interface that allows operators of any skill level to measure and obtain results in as few as three clicks. Built on the same comprehensive platform that underpins Rigaku’s most sophisticated XRDs like the SmartLab, EasyX provides simplified access to the functionalities required for routine QC workflows, including automated pass/fail analysis. A user-friendly graphical user interface accessible via the optional touchscreen allows simple operation of the instrument as well as interpretation of the results.
Compact Design
The MiniFlex XpC has the smallest footprint (0.9 m2) of any instrument in its class. This specification includes the touchscreen user interface.
Online Quality Control
A newly developed sample loader makes the MiniFlex XpC ideal for QC operations. For applications with higher-throughput levels, the system can be integrated with a sample loading robot or a conveyor.... Read More | The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and nanocrcrystals as small as tens of nanometers, opening up many new possibilities. This new capability allows you to go beyond the limitations of X-ray diffraction (XRD), which requires samples greater them 1 µm.
- Directly determine 3D molecular structures of submicron crystals for the first time
- Rigaku’s high-speed, high-sensitivity photon counting detector - HyPix-ED
- JEOL’s expertise in generation and control of stable electron beams – 200 kV electron source and optics
- Rigaku’s powerful single crystal analysis software – CrysAlisPro-ED
3DED/microED is an excellent complementary technique to XRD, and the compact design of the XtaLAB Synergy-ED allows it to be easily located in laboratories alongside these instruments. Crystallographers familiar with Rigaku diffractometers running CrysAlisPRO will be able to adapt to the CrysAlisPRO-ED interface very quickly, as it is based on the same intuitive platform.
The fully integrated system incorporates a seamless workflow from data collection to structure determination of three-dimensional molecular structures. AutoChem, which is fully integrated into CrysAlisPRO, performs fast, fully automated structure solution and refinement during data collection, optimizing your productivity.
3DED/microED allows direct structural determination of sub-micron sized crystals that could only previously be postulated by techniques such as NMR. As an emerging technique, there is scope for the generation of many publications using the XtaLAB Synergy-ED.
... Read More | The XtaLAB Synergy-i single crystal X-ray diffractometer includes a high-flux, low maintenance microfocus sealed tube X-ray instrument with a high precision 4-circle kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector known as the HyPix-Bantam. The XtaLAB Synergy-i containsThe XtaLAB Synergy-i single crystal X-ray diffractometer includes a high-flux, low maintenance microfocus sealed tube X-ray instrument with a high precision 4-circle kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector known as the HyPix-Bantam. The XtaLAB Synergy-i contains the latest technology and can be upgraded from a single source to a dual source instrument. The system can be equipped with Cu and/or Mo sources allowing for a broad range of sample types to be evaluated. The XtaLAB Synergy-i is controlled by the fully-integrated, user-inspired CrysAlisPro software package that is capable of collecting and processing data efficiently and accurately, so you achieve the best data possible.
The XtaLAB Synergy-i is a full-featured single crystal X-ray diffractometer that requires little servicing to maximize uptime and throughput. It is the ideal diffractometer for crystallography research laboratories.
Features: - Up to 50 W microfocus X-ray tube with multilayer optics
- High precision 4-circle kappa goniometer
- State-of-the-art HPC technology detector, the HyPix-Bantam
- New cabinet design with controlled sample and cabinet lighting
- The system conforms to the most stringent of X-ray safety guidelines
- CrysAlisPro: Powerful, user-friendly software, comes standard with AutoChem3.0 for fully-automated structure solution and refinement
- Simple dual-source upgrade
... Read More |
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