X-Ray Diffractometer (XRD Instruments)

X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.

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CompanyRigaku CorporationRigaku CorporationRigaku CorporationRigaku CorporationRigaku Corporation
ItemAutoMATE IIDicifferX WAXS Edition High-speed wide-angle X-ray Scattering SystemMiniFlex Benchtop X-ray DiffractometerMiniflex XpC XRDXtaLAB Synergy-i Single Crystal X-ray Diffractometer
Citations
Catalog NumberAutoMATE IIDicifferX WAXSMiniFlexMiniFlex XpCXtaLAB Synergy-i
Price
X-Ray TubeCr (Maximum load 2 kW), Effective focus size 1 × 10 mm2 (N.F.), Short type1.2 kW micro source rotating anode X-ray generatorInquire600 WInquire
X-Ray Generator3 kW sealed X-ray tubeInquireCu, Co, Fe, or Cr, 40 kV, 15 mACompact 800 W generator and compact X-ray tubeInquire
Goniometer Typetwo-axis goniometerWAXS cameraVertical, Theta or 2ThetaΘ-Θ sample horizontal goniometerInquire
Detector(s)D/teX Ultra 1000High-energy resolution 2D hybrid pixel array detector (HyPix)D/teX, Ultra 1D High speed silicon strip detectorD/teX Ultra silicon stripHyPix-Bantam
DescriptionThe AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.

The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and
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Breakthrough speed and versatility for polymer structure analysis
  • Next-generation WAXS system equipped with a high-brilliance X-ray source
  • Structural information captured non-destructively in just a few seconds of exposure
  • Time-resolved in-situ measurements for heating, stretching, and
... Read More
New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is ... Read MoreThe Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing ... Read MoreThe XtaLAB Synergy-i single crystal X-ray diffractometer includes a high-flux, low maintenance microfocus sealed tube X-ray instrument with a high precision 4-circle kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector known as the HyPix-Bantam. The XtaLAB Synergy-i contains... Read More
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