X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | SmartLab High-Resolution Diffraction System | AutoMATE II | DicifferX WAXS Edition | DicifferX WAXS Edition High-speed wide-angle X-ray Scattering System | XtaLAB Synergy-ED Electron Diffractometer |
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| Catalog Number | SmartLab | AutoMATE II | | DicifferX WAXS | XtaLAB Synergy-ED |
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| X-Ray Tube | 3 kW sealed X-ray tube | Cr (Maximum load 2 kW), Effective focus size 1 × 10 mm2 (N.F.), Short type | Inquire | 1.2 kW micro source rotating anode X-ray generator | Inquire |
| X-Ray Generator | 9.0 kW Rotating Anode Generator | 3 kW sealed X-ray tube | High-brilliance rotating anode with multilayer focusing mirror (10^9 cps at 200 µm beam) | Inquire | Inquire |
| Goniometer Type | High Resolution Theta/Theta Closed Loop | two-axis goniometer | No goniometer (open stage design) | WAXS camera | Single rotation axis |
| Detector(s) | D/teX Ultra 250 silicon strip detector | D/teX Ultra 1000 | HyPix-6000 2D HPAD on motorized 2-axis stage | High-energy resolution 2D hybrid pixel array detector (HyPix) | High-speed, high-sensitivity photon-counting detector, HyPix-ED |
| Description | The SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fullyThe SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fully automated optical system to make advanced measurements possible for both expert and novice users of the system.
Winner of the 2006 R&D 100 Award for technical innovation, the SmartLab is design for completely automated analysis of thin films and other advanced materials. Powered by Guidance, Rigaku's revolutionary knowledge based software package, SmartLab uses fully deveopled measurement packages for completely automated measurement of thin films, nanomaterials, powders, and liquids. Measurement packages exist for powder diffraction, glancing incidence diffraction, in-plane diffraction, X-ray reflectivity, and small angle X-ray scattering (SAXS) measurements.
Features - Θ/Θ design for horizontal sample mounting
- Closed loop drive system for high resolution scanning
- Optional 9.0 kW rotating anode generator
- Fully automatic system alignment
- Guidance software based automated measurement
- 300 mm wafer handling
- CBO for focusing and parallel beam geometries without reconfiguration
- In-plane diffraction arm for in-plane measurements without reconfiguration
- High resolution optics
- SAXS capabilities
... Read More | The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and perform scans with minimum steps of 0.1 microns when using the automated XYZ stage.
Features: - Highly accurate goniometer allows for true micro-area residual stress measurement.
- Automatic mapping measurements with teaching function.
- An X-ray radiation enclosure with interlock system automatically locks the enclosure door when the X-ray shutter is open.
- The measurement position is adjusted by _x000B_a CCD camera equipped with a microscope having a zoom function.
- The two-axis goniometer system allows for both iso-inclination _x000B_and side-inclination methods automatically without readjustment of the sample position.
... Read More | Inquire | Breakthrough speed and versatility for polymer structure analysis
- Next-generation WAXS system equipped with a high-brilliance X-ray source
- Structural information captured non-destructively in just a few seconds of exposure
- Time-resolved in-situ measurements for heating, stretching, and
Breakthrough speed and versatility for polymer structure analysis
- Next-generation WAXS system equipped with a high-brilliance X-ray source
- Structural information captured non-destructively in just a few seconds of exposure
- Time-resolved in-situ measurements for heating, stretching, and humidity conditions
DicifferX WAXS Edition redefines what’s possible for in-house WAXS measurements.
By delivering structural insights in seconds, it accelerates decision-making and drives rapid innovation.
Studies once requiring long measurement times or external facilities can now be performed directly in your
own laboratory, streamlining workflows and empowering faster materials development.... Read More | The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and nanocrcrystals as small as tens of nanometers, opening up many new possibilities. This new capability allows you to go beyond the limitations of X-ray diffraction (XRD), which requires samples greater them 1 µm.
- Directly determine 3D molecular structures of submicron crystals for the first time
- Rigaku’s high-speed, high-sensitivity photon counting detector - HyPix-ED
- JEOL’s expertise in generation and control of stable electron beams – 200 kV electron source and optics
- Rigaku’s powerful single crystal analysis software – CrysAlisPro-ED
3DED/microED is an excellent complementary technique to XRD, and the compact design of the XtaLAB Synergy-ED allows it to be easily located in laboratories alongside these instruments. Crystallographers familiar with Rigaku diffractometers running CrysAlisPRO will be able to adapt to the CrysAlisPRO-ED interface very quickly, as it is based on the same intuitive platform.
The fully integrated system incorporates a seamless workflow from data collection to structure determination of three-dimensional molecular structures. AutoChem, which is fully integrated into CrysAlisPRO, performs fast, fully automated structure solution and refinement during data collection, optimizing your productivity.
3DED/microED allows direct structural determination of sub-micron sized crystals that could only previously be postulated by techniques such as NMR. As an emerging technique, there is scope for the generation of many publications using the XtaLAB Synergy-ED.
... Read More |
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