X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | SmartLab High-Resolution Diffraction System | AutoMATE II | DicifferX WAXS Edition High-speed wide-angle X-ray Scattering System | Rigaku XtaLAB Synergy Flow Automated Single Crystal XRD | XtaLAB Synergy-R High-flux Rotating Anode X-ray Diffractometer |
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| Catalog Number | SmartLab | AutoMATE II | DicifferX WAXS | | XtaLAB Synergy-R |
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| X-Ray Tube | 3 kW sealed X-ray tube | Cr (Maximum load 2 kW), Effective focus size 1 × 10 mm2 (N.F.), Short type | 1.2 kW micro source rotating anode X-ray generator | Inquire | Inquire |
| X-Ray Generator | 9.0 kW Rotating Anode Generator | 3 kW sealed X-ray tube | Inquire | Inquire | Inquire |
| Goniometer Type | High Resolution Theta/Theta Closed Loop | two-axis goniometer | WAXS camera | Intelligent Goniometer Head (IGH) with motorized automation; automated sample centering in as little as 6 seconds | Inquire |
| Detector(s) | D/teX Ultra 250 silicon strip detector | D/teX Ultra 1000 | High-energy resolution 2D hybrid pixel array detector (HyPix) | Direct X-ray detection detectors (varies by Synergy base model selected) | Inquire |
| Description | The SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fullyThe SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fully automated optical system to make advanced measurements possible for both expert and novice users of the system.
Winner of the 2006 R&D 100 Award for technical innovation, the SmartLab is design for completely automated analysis of thin films and other advanced materials. Powered by Guidance, Rigaku's revolutionary knowledge based software package, SmartLab uses fully deveopled measurement packages for completely automated measurement of thin films, nanomaterials, powders, and liquids. Measurement packages exist for powder diffraction, glancing incidence diffraction, in-plane diffraction, X-ray reflectivity, and small angle X-ray scattering (SAXS) measurements.
Features - Θ/Θ design for horizontal sample mounting
- Closed loop drive system for high resolution scanning
- Optional 9.0 kW rotating anode generator
- Fully automatic system alignment
- Guidance software based automated measurement
- 300 mm wafer handling
- CBO for focusing and parallel beam geometries without reconfiguration
- In-plane diffraction arm for in-plane measurements without reconfiguration
- High resolution optics
- SAXS capabilities
... Read More | The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and perform scans with minimum steps of 0.1 microns when using the automated XYZ stage.
Features: - Highly accurate goniometer allows for true micro-area residual stress measurement.
- Automatic mapping measurements with teaching function.
- An X-ray radiation enclosure with interlock system automatically locks the enclosure door when the X-ray shutter is open.
- The measurement position is adjusted by _x000B_a CCD camera equipped with a microscope having a zoom function.
- The two-axis goniometer system allows for both iso-inclination _x000B_and side-inclination methods automatically without readjustment of the sample position.
... Read More | Breakthrough speed and versatility for polymer structure analysis
- Next-generation WAXS system equipped with a high-brilliance X-ray source
- Structural information captured non-destructively in just a few seconds of exposure
- Time-resolved in-situ measurements for heating, stretching, and
Breakthrough speed and versatility for polymer structure analysis
- Next-generation WAXS system equipped with a high-brilliance X-ray source
- Structural information captured non-destructively in just a few seconds of exposure
- Time-resolved in-situ measurements for heating, stretching, and humidity conditions
DicifferX WAXS Edition redefines what’s possible for in-house WAXS measurements.
By delivering structural insights in seconds, it accelerates decision-making and drives rapid innovation.
Studies once requiring long measurement times or external facilities can now be performed directly in your
own laboratory, streamlining workflows and empowering faster materials development.... Read More | Inquire | The XtaLAB Synergy-R is the most powerful small molecule diffractometer available. It includes a high-flux, low-maintenance microfocus rotating anode, the PhotonJet-R, with a high-precision kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector the HyPix-6000HE. The PhotonJet-The XtaLAB Synergy-R is the most powerful small molecule diffractometer available. It includes a high-flux, low-maintenance microfocus rotating anode, the PhotonJet-R, with a high-precision kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector the HyPix-6000HE. The PhotonJet-R X-ray source is comprised of a Micromax-007 HF rotating anode and a newly designed optic. It is available with either Cu or Mo anodes.
This single crystal X-ray diffractometer has been specially designed to fully integrate the rotating anode X-ray source with all system components and software making it a sleek, simple to use diffractometer without compromising the X-ray intensity.
For labs with high-throughput requirements, increasing the flux reduces data collection time and thus increases the number of samples that can be studied in your laboratory. For extremely small samples, additional flux will extend the minimum size limits for crystals that you can study.
Features: - True shutterless data collection
- Noise-free HPC X-ray detector for better measurement of weak data
- 4-circle kappa goniometer with high accuracy and speed
- Fast workflow due to complete integration of software and hardware
- Excels at the most challenging applications, e.g. MOFs or incommensurate structures
- Extremely high performance due to bright source, noise-free detector and fast goniometer speeds
- Provides unparalleled throughput
- Compact design to fit in your laboratory
... Read More |
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