X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
|  |  |
| Company | Malvern Panalytical | Malvern Panalytical |
| Item | Crystal Orientation XRD-OEM – Automated XRD System | Empyrean XAS |
| Catalog Number | XRD-OEM | Empyrean XAS |
| Price | | |
| Detector(s) | Inquire | 1Der Advanced detector |
| Description | XRD-OEM is a game-changer for your production processes. Built to withstand the challenging conditions of grinding and sawing, this X-ray diffraction instrument offers seamless integration with any processing system thanks to its industry-standard interfacing. XRD-OEM provides independent XRD-OEM is a game-changer for your production processes. Built to withstand the challenging conditions of grinding and sawing, this X-ray diffraction instrument offers seamless integration with any processing system thanks to its industry-standard interfacing. XRD-OEM provides independent orientation measurement of ingots, boules, or panels, enabling measurements on both flat surfaces and circumferences – while optical notch detection ensures precise pre-alignment before sawing or grinding processes.
Features and Benefits
- Compact and connected
Designed to integrate effortlessly with any automation or processing system, XRD-OEM enables a streamlined, efficient, and continuous operation. Its compact form and standard industrial interfaces ensure that it fits easily into any manufacturing setup and works well with your existing instruments and systems.
- Tough enough for your process
Built for resilience, XRD-OEM can be deployed in whichever environment you need it, including in grinding and sawing processes. It stays reliable and precise, even under demanding production conditions.
- Fast and precise
XRD-OEM offers automated precision where it matters the most. Precise determination of crystal orientation supports your high standards of quality control while optimizing your processes for greater efficiency and overall quality.
XRD-OEM can determine crystal orientation on both flat surfaces and circumferences for extra versatility.
- Optical notch detection
Optical notch detection precisely identifies and characterizes flat and notch features on your samples – essential during the pre-alignment of large ingots before the sawing or grinding processes.
- Wide range of sample sizes
XRD-OEM can determine crystal orientation on both flat surfaces and circumferences for extra versatility.
... Read More | Empyrean XAS brings laboratory-based XANES and EXAFS measurements to the X-ray diffraction (XRD), X-ray scattering, and imaging techniques of the Empyrean platform.
By enabling multiple structural techniques on a single instrument, Empyrean connects long-range structure, nanoscale organization, Empyrean XAS brings laboratory-based XANES and EXAFS measurements to the X-ray diffraction (XRD), X-ray scattering, and imaging techniques of the Empyrean platform.
By enabling multiple structural techniques on a single instrument, Empyrean connects long-range structure, nanoscale organization, and local chemical environments within one consistent workflow.
Key highlights of the Empyrean XAS:
- Reveal oxidation state, local structure, and chemical state information beyond average crystallographic structure.
- Perform routine XANES and EXAFS measurements without competing for synchrotron beamtime.
- Combine XAS, XRD, scattering, PDF, and imaging on a single Empyrean platform.
- Generate synchrotron-comparable data with excellent agreement to reference synchrotron measurements.
... Read More |
| Get Quote | | |