X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
|  |  |  |  |  |
| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | DicifferX WAXS Edition | AutoMATE II | MiniFlex Benchtop X-ray Diffractometer | Miniflex XpC XRD | XtaLAB mini™ II Benchtop X-ray Diffraction/Crystallography System |
| Citations | | | | | |
| Catalog Number | | AutoMATE II | MiniFlex | MiniFlex XpC | XtaLAB mini II |
| Price | | | | | |
| X-Ray Tube | Inquire | Cr (Maximum load 2 kW), Effective focus size 1 × 10 mm2 (N.F.), Short type | Inquire | 600 W | standard X-ray tubes |
| X-Ray Generator | High-brilliance rotating anode with multilayer focusing mirror (10^9 cps at 200 µm beam) | 3 kW sealed X-ray tube | Cu, Co, Fe, or Cr, 40 kV, 15 mA | Compact 800 W generator and compact X-ray tube | Standard sealed tube X-ray source running at 600 W coupled to a special curved monochromator to produce usable X-ray flux comparable to a standard X-ray diffractometer |
| Goniometer Type | No goniometer (open stage design) | two-axis goniometer | Vertical, Theta or 2Theta | Θ-Θ sample horizontal goniometer | Rugged two-axis goniometer with fixed detector |
| Detector(s) | HyPix-6000 2D HPAD on motorized 2-axis stage | D/teX Ultra 1000 | D/teX, Ultra 1D High speed silicon strip detector | D/teX Ultra silicon strip | HyPix-Bantam two-dimensional semiconductor X-ray detector |
| Description | Inquire | The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and perform scans with minimum steps of 0.1 microns when using the automated XYZ stage.
Features: - Highly accurate goniometer allows for true micro-area residual stress measurement.
- Automatic mapping measurements with teaching function.
- An X-ray radiation enclosure with interlock system automatically locks the enclosure door when the X-ray shutter is open.
- The measurement position is adjusted by _x000B_a CCD camera equipped with a microscope having a zoom function.
- The two-axis goniometer system allows for both iso-inclination _x000B_and side-inclination methods automatically without readjustment of the sample position.
... Read More | New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview: - New 6th generation design
- Compact, fail-safe radiation enclosure
- Incident beam variable slit
- Simple installation and user training
- Factory aligned goniometer system
- Laptop computer operation
Measurements: - Phase identification
- Phase quantification
- Percent (%) crystallinity
- Crystallite size and strain
- Lattice parameter refinement
- Rietveld refinement
- Molecular structure
Options: - 8-position autosampler
- Graphite monochromator
- D/teX Ultra: silicon strip detector
- HyPix-400 MF: 2D HPAD detector
- Air sensitive sample holder
- Travel case
... Read More | The Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing The Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing floor.
With this in mind, the MiniFlex XpC allows you to process more samples faster, and to gain greater control over your process to ensure consistent quality of your final product. The system is characterized by streamlined operation, rapid analysis with pass/fail evaluation and the ability to automate and integrate with other complementary analytical instruments. The MiniFlex XpC offers the performance level of much larger systems, in the world’s smallest footprint for an online XRD.
Features:
Analytical speed and accuracy are paramount in industrial operations. These factors have been addressed in the design of the MiniFlex XpC by using: - A newly design compact, 800 W high-flux X-ray source and power supply
- World’s largest area/high-throughput 1D detector, enabling higher-intensity data collection
- Optimized θ / θ sample geometry that maintains a horizontal sample orientation
- Streamlined user interface
- Compatibility with sample loading robots or conveyors
- Compact design that can easily be incorporated into existing operations
- A recently patented variable-width scattering slit minimizing background at lower angles
- Sample spinner that negates the effects of preferred orientation
- Uses industry standard steel ring sample holders
Streamlined Operation
In addition to sample loading automation, Rigaku has introduced EasyX, a simplified user interface that allows operators of any skill level to measure and obtain results in as few as three clicks. Built on the same comprehensive platform that underpins Rigaku’s most sophisticated XRDs like the SmartLab, EasyX provides simplified access to the functionalities required for routine QC workflows, including automated pass/fail analysis. A user-friendly graphical user interface accessible via the optional touchscreen allows simple operation of the instrument as well as interpretation of the results.
Compact Design
The MiniFlex XpC has the smallest footprint (0.9 m2) of any instrument in its class. This specification includes the touchscreen user interface.
Online Quality Control
A newly developed sample loader makes the MiniFlex XpC ideal for QC operations. For applications with higher-throughput levels, the system can be integrated with a sample loading robot or a conveyor.... Read More | Benchtop small molecule structure determination
The Rigaku XtaLAB mini II benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II Benchtop small molecule structure determination
The Rigaku XtaLAB mini II benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II will enhance research productivity by offering affordable structure analysis capability without the necessity of relying on a departmental facility. With the XtaLAB mini II, you no longer have to wait in line to determine your structures. Instead your research group can rapidly analyze new compounds as they are synthesized in the lab.
Teach diffraction through hands-on experience -
In many universities, the departmental X-ray diffractometer is considered off limits to students because of fear that the instrument might be damaged by inexperienced users. The XtaLAB mini II provides the opportunity for students to learn single crystal analysis by actually using a diffractometer. This is not a black box instrument. Rather, the important step of mounting a crystal on the goniometer and physically centering the crystal in the position of the X-ray beam, ensures that students learn the importance of mounting techniques and crystal selection. The simple design of the XtaLAB mini II minimizes the danger of students damaging the system.
Reduced size does not mean reduced data quality -
The Rigaku XtaLAB mini II is a research grade chemical crystallography instrument that sits on the benchtop. No data quality compromises, no extended collection times. Results delivered are unambiguous. X-ray tube lifetime is extended by running at 600 W. To compensate for running at a lower power, a SHINE optic (special curved monochromator) is utilized to produce usable X-ray flux comparable to a standard X-ray system.
Dedicated to producing publication quality structures -
The chief design requirement when creating the XtaLAB mini II was that the structures produced would be publishable in the most demanding scientific journals. The HPC detector is positioned so that the maximum 2θ value is well outside of the Acta Cryst. requirements. The software provides all the tools you need to generate publication quality data that can be used to determine 3D structures from a variety of structure analysis packages.
Features: - Affordable design with low operating costs
- Requires minimal training and support
- Automatic structure solution software
- Provides definitive structural information
- Ideal supplement for a NMR spectrometer
- Perfect self-serve departmental lab instrument
- Ideal teaching instrument
- Publication quality results
- Air-cooled HPC detector
- No special infrastructure required (110 VAC)
- Optional cryosystem available
... Read More |
| Get Quote | | | | | |