X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | DicifferX WAXS Edition | DicifferX WAXS Edition High-speed wide-angle X-ray Scattering System | LabLinc Studio Modular Integration platform for Autonomous Labs | MiniFlex Benchtop X-ray Diffractometer |
| Citations | | | | |
| Catalog Number | | DicifferX WAXS | LabLinc Studio | MiniFlex |
| Price | | | | |
| X-Ray Tube | Inquire | 1.2 kW micro source rotating anode X-ray generator | Inquire | Inquire |
| X-Ray Generator | High-brilliance rotating anode with multilayer focusing mirror (10^9 cps at 200 µm beam) | Inquire | Inquire | Cu, Co, Fe, or Cr, 40 kV, 15 mA |
| Goniometer Type | No goniometer (open stage design) | WAXS camera | Inquire | Vertical, Theta or 2Theta |
| Detector(s) | HyPix-6000 2D HPAD on motorized 2-axis stage | High-energy resolution 2D hybrid pixel array detector (HyPix) | Inquire | D/teX, Ultra 1D High speed silicon strip detector |
| Description | Inquire | Breakthrough speed and versatility for polymer structure analysis
- Next-generation WAXS system equipped with a high-brilliance X-ray source
- Structural information captured non-destructively in just a few seconds of exposure
- Time-resolved in-situ measurements for heating, stretching, and
Breakthrough speed and versatility for polymer structure analysis
- Next-generation WAXS system equipped with a high-brilliance X-ray source
- Structural information captured non-destructively in just a few seconds of exposure
- Time-resolved in-situ measurements for heating, stretching, and humidity conditions
DicifferX WAXS Edition redefines what’s possible for in-house WAXS measurements.
By delivering structural insights in seconds, it accelerates decision-making and drives rapid innovation.
Studies once requiring long measurement times or external facilities can now be performed directly in your
own laboratory, streamlining workflows and empowering faster materials development.... Read More | LabLinc Studio is Rigaku’s modular integration offering for autonomous labs, combining RAI (Rigaku Automation Interface), SmartLab software workflow packaging, and optional automation hardware (sample handling, robots, robot-compatible doors/enclosures) plus technical support. Critical instrument LabLinc Studio is Rigaku’s modular integration offering for autonomous labs, combining RAI (Rigaku Automation Interface), SmartLab software workflow packaging, and optional automation hardware (sample handling, robots, robot-compatible doors/enclosures) plus technical support. Critical instrument settings are exposed through Python API for easy integration of analytical instruments into autonomous labs and AI-driven materials discovery loop.... Read More | New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview: - New 6th generation design
- Compact, fail-safe radiation enclosure
- Incident beam variable slit
- Simple installation and user training
- Factory aligned goniometer system
- Laptop computer operation
Measurements: - Phase identification
- Phase quantification
- Percent (%) crystallinity
- Crystallite size and strain
- Lattice parameter refinement
- Rietveld refinement
- Molecular structure
Options: - 8-position autosampler
- Graphite monochromator
- D/teX Ultra: silicon strip detector
- HyPix-400 MF: 2D HPAD detector
- Air sensitive sample holder
- Travel case
... Read More |
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