| X-Ray Generator | Inquire | Cu, Co, Fe, or Cr, 40 kV, 15 mA | 9.0 kW Rotating Anode Generator | Inquire | MicroMax-007 HF microfocus rotating anode source or the highest-flux in-house X-ray source, the FR-X (Mo, Cu, or Cr). |
| Detector(s) | Direct X-ray detection detectors (varies by Synergy base model selected) | D/teX, Ultra 1D High speed silicon strip detector | D/teX Ultra 250 silicon strip detector | HyPix-400 2D, D/teX Ultra 250 1D | HyPix-6000HE, the large theta coverage HyPix-Arc 150° or the Dectris EIGER 4M. |
| Description | Inquire | New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview: - New 6th generation design
- Compact, fail-safe radiation enclosure
- Incident beam variable slit
- Simple installation and user training
- Factory aligned goniometer system
- Laptop computer operation
Measurements: - Phase identification
- Phase quantification
- Percent (%) crystallinity
- Crystallite size and strain
- Lattice parameter refinement
- Rietveld refinement
- Molecular structure
Options: - 8-position autosampler
- Graphite monochromator
- D/teX Ultra: silicon strip detector
- HyPix-400 MF: 2D HPAD detector
- Air sensitive sample holder
- Travel case
... Read More | The SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fullyThe SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fully automated optical system to make advanced measurements possible for both expert and novice users of the system.
Winner of the 2006 R&D 100 Award for technical innovation, the SmartLab is design for completely automated analysis of thin films and other advanced materials. Powered by Guidance, Rigaku's revolutionary knowledge based software package, SmartLab uses fully deveopled measurement packages for completely automated measurement of thin films, nanomaterials, powders, and liquids. Measurement packages exist for powder diffraction, glancing incidence diffraction, in-plane diffraction, X-ray reflectivity, and small angle X-ray scattering (SAXS) measurements.
Features - Θ/Θ design for horizontal sample mounting
- Closed loop drive system for high resolution scanning
- Optional 9.0 kW rotating anode generator
- Fully automatic system alignment
- Guidance software based automated measurement
- 300 mm wafer handling
- CBO for focusing and parallel beam geometries without reconfiguration
- In-plane diffraction arm for in-plane measurements without reconfiguration
- High resolution optics
- SAXS capabilities
... Read More | The SmartLab SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross The SmartLab SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and advanced photon counting hybrid pixel array detectors (HPAD).
Features: - SmartLab Studio II software based on a new architecturally integrated modular platform
- Cross-beam optics module switches between Bragg-Brentano and parallel beam without the need to change optics.
- HyPix-400 2D detector enables seamless switch between 0D, 1D and 2D detection mode depending on application type.
- D/teX Ultra 250 1D detector accelerates powder diffraction by a factor of 250 in speed and provides adjustable energy resolution of approximately 20% or 4% depending on
sample type. - Integrated intelligent Guidance software enables fully automated measurement including optics and sample alignment.
- Self-aligned optics maximize instrument uptime and minimize cost of ownership.
... Read More | Customized Single Crystal Diffraction System With Microfocus Rotating Anode Generator
Features: - Ultimate flexibility with customized X-ray system specifically tailored to the needs of your research. Dual ports allow for various combinations of crystallography and SAXS configurations. Your choice
Customized Single Crystal Diffraction System With Microfocus Rotating Anode Generator
Features: - Ultimate flexibility with customized X-ray system specifically tailored to the needs of your research. Dual ports allow for various combinations of crystallography and SAXS configurations. Your choice of VariMax™ confocal double-bounce optics for better spectral purity and beam size to match your sample types.
- Faster, accurate data collection due to high-speed kappa goniometer, high-flux rotating anode X-ray source, fast, low-noise X-ray detector, and highly optimized instrument control software.
- Improve your ability to investigate small samples due to the increased flux from the rotating anode X-ray source as well as the extreme low noise of the HyPix X-ray detectors. Noise-free images mean you can count longer for weakly diffracting crystals without a loss in data quality arising from detector noise.
- Screen crystals in situ with optional XtalCheck crystallization plate screening device.
- Enhance your ability to resolve large unit cells, twins or incommensurate lattices when you select the optional motorized variable beam slit in order to alter divergence to adapt the source to your sample’s requirements.
... Read More |