X-Ray Diffractometer (XRD Instruments)

X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.

Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.

CompanyRigaku CorporationRigaku CorporationRigaku CorporationRigaku CorporationRigaku Corporation
ItemDicifferX WAXS Edition High-speed wide-angle X-ray Scattering SystemAutoMATE IIDicifferX WAXS EditionXtaLAB mini™ II Benchtop X-ray Diffraction/Crystallography SystemXtaLAB Synergy-DW Versatile Dual Wavelength XRD with HPC X-ray Detector
Citations
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Catalog NumberDicifferX WAXSAutoMATE IIXtaLAB mini IIXtaLAB Synergy-DW
Price
X-Ray Tube1.2 kW micro source rotating anode X-ray generatorCr (Maximum load 2 kW), Effective focus size 1 × 10 mm2 (N.F.), Short typeInquirestandard X-ray tubesInquire
X-Ray GeneratorInquire3 kW sealed X-ray tubeHigh-brilliance rotating anode with multilayer focusing mirror (10^9 cps at 200 µm beam)Standard sealed tube X-ray source running at 600 W coupled to a special curved monochromator to produce usable X-ray flux comparable to a standard X-ray diffractometerDual wavelength X-ray source
Goniometer TypeWAXS cameratwo-axis goniometerNo goniometer (open stage design)Rugged two-axis goniometer with fixed detectorkappa goniometer
Detector(s)High-energy resolution 2D hybrid pixel array detector (HyPix)D/teX Ultra 1000HyPix-6000 2D HPAD on motorized 2-axis stageHyPix-Bantam two-dimensional semiconductor X-ray detectorHPC detector
DescriptionBreakthrough speed and versatility for polymer structure analysis
  • Next-generation WAXS system equipped with a high-brilliance X-ray source
  • Structural information captured non-destructively in just a few seconds of exposure
  • Time-resolved in-situ measurements for heating, stretching, and
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The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.

The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and
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InquireBenchtop small molecule structure determination

The Rigaku XtaLAB mini II benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II
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One source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide... Read More
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