X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | LabLinc Studio Modular Integration platform for Autonomous Labs | DicifferX WAXS Edition | MiniFlex Benchtop X-ray Diffractometer | XtaLAB Synergy-S Single or Dual Microfocus X-ray Diffractometer |
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| Catalog Number | LabLinc Studio | | MiniFlex | XtaLAB Synergy-S |
| Price | | | | |
| X-Ray Tube | Inquire | Inquire | Inquire | Inquire |
| X-Ray Generator | Inquire | High-brilliance rotating anode with multilayer focusing mirror (10^9 cps at 200 µm beam) | Cu, Co, Fe, or Cr, 40 kV, 15 mA | Inquire |
| Goniometer Type | Inquire | No goniometer (open stage design) | Vertical, Theta or 2Theta | Inquire |
| Detector(s) | Inquire | HyPix-6000 2D HPAD on motorized 2-axis stage | D/teX, Ultra 1D High speed silicon strip detector | Inquire |
| Description | LabLinc Studio is Rigaku’s modular integration offering for autonomous labs, combining RAI (Rigaku Automation Interface), SmartLab software workflow packaging, and optional automation hardware (sample handling, robots, robot-compatible doors/enclosures) plus technical support. Critical instrument LabLinc Studio is Rigaku’s modular integration offering for autonomous labs, combining RAI (Rigaku Automation Interface), SmartLab software workflow packaging, and optional automation hardware (sample handling, robots, robot-compatible doors/enclosures) plus technical support. Critical instrument settings are exposed through Python API for easy integration of analytical instruments into autonomous labs and AI-driven materials discovery loop.... Read More | Inquire | New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview: - New 6th generation design
- Compact, fail-safe radiation enclosure
- Incident beam variable slit
- Simple installation and user training
- Factory aligned goniometer system
- Laptop computer operation
Measurements: - Phase identification
- Phase quantification
- Percent (%) crystallinity
- Crystallite size and strain
- Lattice parameter refinement
- Rietveld refinement
- Molecular structure
Options: - 8-position autosampler
- Graphite monochromator
- D/teX Ultra: silicon strip detector
- HyPix-400 MF: 2D HPAD detector
- Air sensitive sample holder
- Travel case
... Read More | With your success utmost in our minds, we have developed the XtaLAB Synergy-S X-ray diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy-S produces With your success utmost in our minds, we have developed the XtaLAB Synergy-S X-ray diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy-S produces fast, precise data in an intelligent fashion.
The system is based around the PhotonJet-S series of microfocus X-ray sources that incorporate continuously variable divergence slits. These third generation sources have been designed to maximize X-ray photons at the sample by using a combination of new optics, new, longer life, tubes and an improved alignment system. PhotonJets are available in Cu, Mo or Ag wavelengths in either a single or dual source configuration.
The XtaLAB Synergy-S single crystal X-ray diffractometer comes with kappa goniometer that incorporates fast motor speeds and a unique telescopic two-theta arm to provide total flexibility for your diffraction experiment. The system is also equipped with your choice of HPC X-ray detector, including the HyPix-6000HE, PILATUS3 R 200K, PILATUS3 R 300K or EIGER 1M.
Features: - Thigh source flux and increased goniometer speed to allow quicker, more agile experiments
- Unique telescopic two-theta arm to reach both longer and shorter crystal-to-detector distances
- Enhanced kappa goniometer design with symmetrical 2? positioning
- Improved X-ray optic alignment mechanism for easy maintenance
- User-inspired cabinet design for improved workflow
- New electronically controlled brightness of cabinet and crystal lighting
- Extremely high performance due to bright source, noise-free X-ray detector and fast goniometer speeds
- Continuously variable divergence slits lets you resolve reflections from long unit cells
- Minimal downtime with longer X-ray tube lifetime - supported by online diagnostics and troubleshooting
- Compact design to fit in your laboratory
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