X-Ray Diffractometer (XRD Instruments)

X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.

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CompanyRigaku CorporationRigaku CorporationRigaku CorporationRigaku CorporationRigaku Corporation
ItemXtaLAB mini™ II Benchtop X-ray Diffraction/Crystallography SystemMiniFlex Benchtop X-ray DiffractometerMiniflex XpC XRDXtaLAB Synergy-CustomXtaLAB Synergy-S Single or Dual Microfocus X-ray Diffractometer
Citations
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Catalog NumberXtaLAB mini IIMiniFlexMiniFlex XpCXtaLAB Synergy-CustomXtaLAB Synergy-S
Price
X-Ray Tubestandard X-ray tubesInquire600 WInquireInquire
X-Ray GeneratorStandard sealed tube X-ray source running at 600 W coupled to a special curved monochromator to produce usable X-ray flux comparable to a standard X-ray diffractometerCu, Co, Fe, or Cr, 40 kV, 15 mACompact 800 W generator and compact X-ray tubeMicroMax-007 HF microfocus rotating anode source or the highest-flux in-house X-ray source, the FR-X (Mo, Cu, or Cr).Inquire
Goniometer TypeRugged two-axis goniometer with fixed detectorVertical, Theta or 2ThetaΘ-Θ sample horizontal goniometerFast kappa geometry goniometerInquire
Detector(s)HyPix-Bantam two-dimensional semiconductor X-ray detectorD/teX, Ultra 1D High speed silicon strip detectorD/teX Ultra silicon stripHyPix-6000HE, the large theta coverage HyPix-Arc 150° or the Dectris EIGER 4M.Inquire
DescriptionBenchtop small molecule structure determination

The Rigaku XtaLAB mini II benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II
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New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is ... Read MoreThe Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing ... Read MoreCustomized Single Crystal Diffraction System With Microfocus Rotating Anode Generator

Features:
  • Ultimate flexibility with customized X-ray system specifically tailored to the needs of your research. Dual ports allow for various combinations of crystallography and SAXS configurations. Your choice
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With your success utmost in our minds, we have developed the XtaLAB Synergy-S X-ray diffractometer for single crystal X-ray diffraction. Using a combination of leading edge components and user-inspired software tied together through a highly parallelized architecture, the XtaLAB Synergy-S produces ... Read More
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