| Description | XRD-OEM is a game-changer for your production processes. Built to withstand the challenging conditions of grinding and sawing, this X-ray diffraction instrument offers seamless integration with any processing system thanks to its industry-standard interfacing. XRD-OEM provides independent XRD-OEM is a game-changer for your production processes. Built to withstand the challenging conditions of grinding and sawing, this X-ray diffraction instrument offers seamless integration with any processing system thanks to its industry-standard interfacing. XRD-OEM provides independent orientation measurement of ingots, boules, or panels, enabling measurements on both flat surfaces and circumferences – while optical notch detection ensures precise pre-alignment before sawing or grinding processes.
Features and Benefits
- Compact and connected
Designed to integrate effortlessly with any automation or processing system, XRD-OEM enables a streamlined, efficient, and continuous operation. Its compact form and standard industrial interfaces ensure that it fits easily into any manufacturing setup and works well with your existing instruments and systems.
- Tough enough for your process
Built for resilience, XRD-OEM can be deployed in whichever environment you need it, including in grinding and sawing processes. It stays reliable and precise, even under demanding production conditions.
- Fast and precise
XRD-OEM offers automated precision where it matters the most. Precise determination of crystal orientation supports your high standards of quality control while optimizing your processes for greater efficiency and overall quality.
XRD-OEM can determine crystal orientation on both flat surfaces and circumferences for extra versatility.
- Optical notch detection
Optical notch detection precisely identifies and characterizes flat and notch features on your samples – essential during the pre-alignment of large ingots before the sawing or grinding processes.
- Wide range of sample sizes
XRD-OEM can determine crystal orientation on both flat surfaces and circumferences for extra versatility.
... Read More | Produce greener and more efficient. The Cement edition of Aeris is an easy-to-use and automatable compact instrument for every stage of the cement production process, from raw
meal, clinker and (blended) cement to the final product.
Aeris is ideal for process control in cement plants and Produce greener and more efficient. The Cement edition of Aeris is an easy-to-use and automatable compact instrument for every stage of the cement production process, from raw
meal, clinker and (blended) cement to the final product.
Aeris is ideal for process control in cement plants and automated Rietveld quantitative analysis
of cement products for related industries such as Departments of Transportation. This compact
instrument is smaller and easier to use than floorstanding equipment and more powerful than
benchtop systems. Aeris delivers the precision, robustness, and efficiency that our customers
know and love – providing outstanding quality with all the convenience of a smaller footprint (no
external cooler required).
Aeris has an optional six position changer, and is automatable – external sample loading from
belt or robot are possible. Aeris has best in class dust protection, with a rating of IP40.
Features:
- Seamless integration in automation - for high sample throughput Aeris can be
connected with a belt or a robot for fast and automated sample processing.
- Fast analysis, maximum uptime - analysis time for clinker or cement is just 5 minutes.
- Industry ready - Compatible with all common industry standards.
... Read More | Meet the new compact XRD system from Malvern Panalytical - Aeris. The Metals edition of Aeris
is ideal for rapid and reliable analysis of direct reduced iron, sinter and retained austenite. The
Aeris Compact is just right. It delivers the precision, robustness, and efficiency that our
customers Meet the new compact XRD system from Malvern Panalytical - Aeris. The Metals edition of Aeris
is ideal for rapid and reliable analysis of direct reduced iron, sinter and retained austenite. The
Aeris Compact is just right. It delivers the precision, robustness, and efficiency that our
customers know and love – providing outstanding quality with all the convenience of a smaller
footprint. It has an optional six position changer, and is automatable – external sample loading
from belt or robot are possible. Aeris has best in class dust protection, with a rating of IP40.
The Aeris Metals edition is your partner at every stage of the production process, from raw
material to the final product.
Features:
- Seamless integration in automation - for high sample throughput Aeris can be
connected with a belt or a robot for fast and automated sample processing.
- Fast analysis, maximum uptime - mineralogical information is available within 5 minutes.
- Strong and robust - Compatible with all common industry standards
... Read More | Aeris Minerals Edition from Malvern
Panalytical
Minerals edition of Aeris is ideal for monitoring mineral phases and tracking process parameters
during ore beneficiation. Aeris delivers best in class data quality and speed, and never requires
an external cooler. The touchscreen interface is easyAeris Minerals Edition from Malvern
Panalytical
Minerals edition of Aeris is ideal for monitoring mineral phases and tracking process parameters
during ore beneficiation. Aeris delivers best in class data quality and speed, and never requires
an external cooler. The touchscreen interface is easy for all to use. Aeris has an optional six
position changer and is automatable – external sample loading from belt or robot are possible.
Aeris has best in class dust protection, with a rating of IP40.
The Aeris Minerals edition is your partner at every stage of the production process, from raw
material to the final product. The Aeris Compact is just right. It delivers the precision, robustness,
and efficiency that our customers know and love – providing outstanding quality with all the
convenience of a smaller footprint.
Features:
- Seamless integration in automation - for high sample throughput Aeris can be
connected with a belt or a robot for fast and automated sample processing.
- Fast analysis, maximum uptime - Typical measurement times of Aeris are less than 10
minutes per sample.
- Strong and robust - Compatible with all common industry standards
... Read More | The X’Pert3 Materials Research Diffractometer (MRD) is the system of choice for detailed structural analysis of advanced semiconductors, thin film, and nanomaterials. It handles a wide variety of X-ray scattering methods, including high resolution diffraction, in-plane diffraction, reflectivity, The X’Pert3 Materials Research Diffractometer (MRD) is the system of choice for detailed structural analysis of advanced semiconductors, thin film, and nanomaterials. It handles a wide variety of X-ray scattering methods, including high resolution diffraction, in-plane diffraction, reflectivity, thin film phase analysis, wafer mapping, GISAXS, stress, texture and nonambient analysis. The X’Pert3 MRD features the highest resolution goniometer with Heidenhain encoders for lightening fast positioning, a 5 axis cradle allowing for support and mapping of wafers up to 6 inches in diameter, and a wide variety of advanced optics and detectors, including the PIXcel3D for fast reciprocal space mapping.... Read More |