X-ray fluorescence spectrometers use high-energy X-rays or gamma rays to excite fluorescent radiation (or photons) from a sample for chemical or elemental analysis. In an energy dispersive X-ray fluorescence spectrometer (EDXRF Spectrometer), the fluorescent photons from the irradiated sample are detected without being separated first (as they are in wavelength dispersive XRF spectrometers). Therefore, EDXRF spectrometers typically have better efficiency, whereas WDXRF spectrometers have better resolution. Energy Dispersive XRF Spectrometers are used to analyze solid samples and although they have broad applications as disparate as petrochemical analysis, food safety, and plastics, one of the main attractions of this technique is that it is non-destructive, which makes it very attractive for analysis of samples that are irreplaceable, such as artifacts from an archeological site. The limit of detection for EDXRF spectrometers is typically in the parts per million (ppm) range.
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| Company | Malvern Panalytical | Malvern Panalytical |
| Item | Epsilon 4 XRF Spectrometer for Elemental Analysis | Epsilon Xline EDXRF |
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| Catalog Number | Epsilon 4 | Epsilon Xline |
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| Element Range | Fluorine (F) to Americium (Am) | Able to measure all valuable elements of interest, including platinum and cerium |
| Sample Type | Solids, Pressed powders, fused beads and liquids | Coating line |
| X-Ray Tube | Metal-ceramic side window for maximum stability, 50 micrometers thin beryllium window for high sensitivity for light elements, Ag anode X-ray tube for best performance of P, S and Cl analysis | Ag |
| Detector(s) | High-resolution silicon drift detector (SDD) | High-resolution Si drift detector SDD10 |
| Sample Chamber | Can accommodate samples up to 52 mm (2 inch) in diameter and has a large sample mode for analyzing samples up to 10 cm in height | Inquire |
| Description | The Epsilon 4 is a multi-functional instrument for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection technologies with mature software and smart design, the analytical The Epsilon 4 is a multi-functional instrument for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection technologies with mature software and smart design, the analytical performance of Epsilon 4 approaches that of more powerful and floor-standing XRF spectrometers.
Industry-specific editions are available: - Epsilon 4 Mining and minerals
- At-line elemental analysis directly in the mine or next to the production line.
- Epsilon 4 Oils and fuels
- Comply with EPA TIER 3 and ISO 13032 for analyzing sulfur in fuels and oils.
- Epsilon 4 Lubricating oils
- Comply with ASTM D7751-15 for analyzing additives in lubricating oils.
- Epsilon 4 Pharmaceuticals and cosmetics
- Comply with ICH Q3D, USP <232>, <233> and <735> for trace element analysis of impurities in excipients and API.
- Epsilon 4 Food and environment
- Comply with EPA IO-3.3 for air filter analysis and ISO 18227, ISO 15309 and ASTM C1255 for soils analysis.
- Epsilon 4 Building materials
- Comply with ASTM C114-15 and reduce the feedback time by placing Epsilon 4 next to the production line
- Epsilon 4 Polymers plastics and paints
- Accurately analyse for additives and catalyst residues (ADPOL), toxic elements (TOXEL) and to ensure RoHS compliancy (RoHS)
... Read More | In-line control for continuous roll-to-roll processes
Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis In-line control for continuous roll-to-roll processes
Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis allows continuous optimization of material composition?and loading, helping to minimize off-specification production and maximize cost-efficiency. The adaptable Epsilon Xline can deliver precise and accurate process control across a wide range of surfaces and elements.
Features:
- Full in-line automation. Enjoy continuous R2R production thanks to the Epsilon Xline’s seamless integration capabilities, suitable for a range of thin-film and coating applications.
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Simple and safe. The Epsilon Xline is fully X-ray safe and easy to use, unlike handheld or legacy instruments, and delivers highly accurate analytical data.
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A lifetime of experience. Drawing on Malvern Panalytical’s more than 70 years’ experience in elemental analysis, the Epsilon Xline was developed in collaboration with our industry partners to meet their needs of today – and at the same time looking to the industry’s future together.
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Maximized yield. Achieve cost-competitive production with real-time monitoring and no disruption – giving you the direct insights and control you need to get the most out of your operations.
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Optimum materials efficiency. Eliminate inconsistencies, avoid wasting precious materials, and ensure a high-quality product with our industry-standard solution.
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Proven, patented accuracy. Developed and tested with customers, the Epsilon Xline features patented height-correction technology that ensures stable analysis for accurate results.
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