X-ray fluorescence spectrometers use high-energy X-rays or gamma rays to excite fluorescent radiation (or photons) from a sample for chemical or elemental analysis. In an energy dispersive X-ray fluorescence spectrometer (EDXRF Spectrometer), the fluorescent photons from the irradiated sample are detected without being separated first (as they are in wavelength dispersive XRF spectrometers). Therefore, EDXRF spectrometers typically have better efficiency, whereas WDXRF spectrometers have better resolution. Energy Dispersive XRF Spectrometers are used to analyze solid samples and although they have broad applications as disparate as petrochemical analysis, food safety, and plastics, one of the main attractions of this technique is that it is non-destructive, which makes it very attractive for analysis of samples that are irreplaceable, such as artifacts from an archeological site. The limit of detection for EDXRF spectrometers is typically in the parts per million (ppm) range.
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| Company | Malvern Panalytical | Malvern Panalytical |
| Item | Epsilon Xline EDXRF | Zetium Ultimate Edition |
| Catalog Number | Epsilon Xline | Zetium Ultimate Edition |
| Price | | |
| Element Range | Able to measure all valuable elements of interest, including platinum and cerium | Boron (B) to Americium (AM) |
| Sample Type | Coating line | Inquire |
| X-Ray Tube | Ag | No-drift SST R-mAX 4 kW X-ray tube, 50 micron window |
| Detector(s) | High-resolution Si drift detector SDD10 | Duplex detector |
| Description | In-line control for continuous roll-to-roll processes
Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis In-line control for continuous roll-to-roll processes
Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis allows continuous optimization of material composition?and loading, helping to minimize off-specification production and maximize cost-efficiency. The adaptable Epsilon Xline can deliver precise and accurate process control across a wide range of surfaces and elements.
Features:
- Full in-line automation. Enjoy continuous R2R production thanks to the Epsilon Xline’s seamless integration capabilities, suitable for a range of thin-film and coating applications.
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Simple and safe. The Epsilon Xline is fully X-ray safe and easy to use, unlike handheld or legacy instruments, and delivers highly accurate analytical data.
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A lifetime of experience. Drawing on Malvern Panalytical’s more than 70 years’ experience in elemental analysis, the Epsilon Xline was developed in collaboration with our industry partners to meet their needs of today – and at the same time looking to the industry’s future together.
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Maximized yield. Achieve cost-competitive production with real-time monitoring and no disruption – giving you the direct insights and control you need to get the most out of your operations.
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Optimum materials efficiency. Eliminate inconsistencies, avoid wasting precious materials, and ensure a high-quality product with our industry-standard solution.
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Proven, patented accuracy. Developed and tested with customers, the Epsilon Xline features patented height-correction technology that ensures stable analysis for accurate results.
... Read More | The Zetium Ultimate edition XRF spectrometer is the most advanced configuration in the Zetium family. The combination of WD and ED core and advanced technologies delivers analytical excellence in every situation, from R&D labs to high-throughput production. The Ultimate edition is pre-configured toThe Zetium Ultimate edition XRF spectrometer is the most advanced configuration in the Zetium family. The combination of WD and ED core and advanced technologies delivers analytical excellence in every situation, from R&D labs to high-throughput production. The Ultimate edition is pre-configured to give unrivaled sensitivity across the periodic table with thin-window, high-power X-ray tube technology, curved crystals and unique detector technology, saving time and increasing throughput in busy laboratories. The Ultimate edition also comes standard with Omnian, our market-leading standardless analysis module, for the qualitative and quantitative elemental analysis of unknowns or materials where calibration samples are not readily available. Other significant advantages combined WD and ED are reduced analytical times, identification of unexpected elements and spectrum archiving. The option for small spot analysis and mapping option using the ED core allows time-efficient data acquisition. The entire spectrum measured by the ED core at every spot reduces measurement times and allows for standardless quantitative data capture.
Smart Zetium:
We continuously strive to help you get the most out of our instruments, and we've connected the Zetium to our Smart Manager platform. This is a cloud-based 'control room' which provides you with a clear picture of the utilization and health of your instruments, wherever they are in the world. By connecting your Zetium to the Smart Manager, we have turned it into a Smart Zetium.... Read More |
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