Energy Dispersive XRF Spectrometer (EDXRF Spectrometer)

X-ray fluorescence spectrometers use high-energy X-rays or gamma rays to excite fluorescent radiation (or photons) from a sample for chemical or elemental analysis. In an energy dispersive X-ray fluorescence spectrometer (EDXRF Spectrometer), the fluorescent photons from the irradiated sample are detected without being separated first (as they are in wavelength dispersive XRF spectrometers). Therefore, EDXRF spectrometers typically have better efficiency, whereas WDXRF spectrometers have better resolution. Energy Dispersive XRF Spectrometers are used to analyze solid samples and although they have broad applications as disparate as petrochemical analysis, food safety, and plastics, one of the main attractions of this technique is that it is non-destructive, which makes it very attractive for analysis of samples that are irreplaceable, such as artifacts from an archeological site. The limit of detection for EDXRF spectrometers is typically in the parts per million (ppm) range.

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CompanyMalvern PanalyticalMalvern Panalytical
ItemZetium Minerals EditionEpsilon Xline EDXRF
Catalog NumberZetium Minerals EditionEpsilon Xline
Price
Element RangeBoron (B) to Americium (AM)Able to measure all valuable elements of interest, including platinum and cerium
Sample TypeInquireCoating line
X-Ray TubeSuper-sharp SST R-mAX X-ray tubesAg
Detector(s)InquireHigh-resolution Si drift detector SDD10
DescriptionThe Zetium Minerals Edition XRF Spectrometer is well suited for materials analysis at all stages of mining. It is pre-configured to cover a wide range of elements at concentrations from ppm to 100%. A new faster sample changer, certification of 20 in-house samples as standards, and Virtual ... Read MoreIn-line control for continuous roll-to-roll processes

Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis
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