
Used widely in the fields of materials testing and characterization, Auger electron spectrometers are commonly used analytical instruments in the study of surfaces. The spectroscopic technique underlying this technology is the Auger effect which analyses Auger electrons that have been emitted from an atom after a bombardment of X-rays and measures their intensity. Most AES experiments are performed under ultra-high vacuum setups to prevent the scattering of electrons off of residual gas atoms. Some common uses for Auger electron spectroscopy include defect analysis, thin film composition, particle analysis, and small-area depth profiling.
Get Quote for All
Select up to 5 products from below to compare or request more information.
JEOL USA, Inc.
- Field Emission Auger Microprobe
- Inquire
- Semiconductor devices, Lithium-ion battery (LIB) materials, REELS analysis, Chemical state analysis, Elemental mapping
Physical Electronics, Inc
- Scanning Auger Nanoprobe
- Inquire
- Surface elemental and chemical state analysis, thin film depth profiling, nano-scale feature characterization, microstructure analysis, semiconductor analysis, insulator analysis, nanovolume characterization, corrosion analysis, metallurgical analysis, additive manufacturing materials analysis
RBD Instruments
- Single Pass CMA (Cylindrical Mirror Analyzer)
- 100:1 on clean silver with 300 nA beam current
- Thin film composition, Passive oxide thicknesses in semiconductors and metals, Metal component thermal oxides, Integrated circuit contamination, Characterization of sputtered layers, Auger depth profiles of deposited layers, Quantization of light element surface films
OCI Vacuum Microengineering
Inquire
Scienta Omicron
- Scanning Auger Microprobe / Auger Electron Spectrometer
- Inquire
- Surface analysis, elemental mapping, depth profiling, nanoscale characterization, magnetic domain imaging (SEMPA), semiconductor analysis, materials science, thin film analysis
Inquire
SPECS Surface Nano Analysis GmbH
Inquire
Select up to 5 products from above to compare or request more information.
Tags:
Please Login or Register to Create Tags