X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.
Find, compare, and request a quote for XRF analyzers across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Malvern Panalytical | Malvern Panalytical | Malvern Panalytical |
| Item | Epsilon 4 XRF Spectrometer for Elemental Analysis | 2830 ZT WDXRF Wafer Analyzer | Zetium Metals Edition |
| Citations | | | |
| Reviews | | | |
| Catalog Number | Epsilon 4 | 2830 ZT | Zetium Metals Edition |
| Price | | | |
| Principle | Energy Dispersive X-ray Fluorescence | Wavelength Dispersive X-ray Fluorescence | Wavelength AND Energy Dispersive Dispersive X-ray Fluorescence |
| X-Ray Tube | Metal-ceramic side window for maximum stability, 50 micrometers thin beryllium window for high sensitivity for light elements, Ag anode X-ray tube for best performance of P, S and Cl analysis | 4 kW SST-mAX X-ray Tube (Super Sharp X-ray Tube) | No-drift SST R-mAX tube |
| Goniometer Type | Inquire | Inquire | Inquire |
| Detector(s) | High-resolution silicon drift detector (SDD) | Hi-Per Scint Detector, Duplex Detector | Hi-Per Scint Detector, Duplex Detector |
| Analysis Diameter | 24 mm | up to 300 mm | Inquire |
| Description | The Epsilon 4 is a multi-functional instrument for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection technologies with mature software and smart design, the analytical The Epsilon 4 is a multi-functional instrument for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection technologies with mature software and smart design, the analytical performance of Epsilon 4 approaches that of more powerful and floor-standing XRF spectrometers.
Industry-specific editions are available: - Epsilon 4 Mining and minerals
- At-line elemental analysis directly in the mine or next to the production line.
- Epsilon 4 Oils and fuels
- Comply with EPA TIER 3 and ISO 13032 for analyzing sulfur in fuels and oils.
- Epsilon 4 Lubricating oils
- Comply with ASTM D7751-15 for analyzing additives in lubricating oils.
- Epsilon 4 Pharmaceuticals and cosmetics
- Comply with ICH Q3D, USP <232>, <233> and <735> for trace element analysis of impurities in excipients and API.
- Epsilon 4 Food and environment
- Comply with EPA IO-3.3 for air filter analysis and ISO 18227, ISO 15309 and ASTM C1255 for soils analysis.
- Epsilon 4 Building materials
- Comply with ASTM C114-15 and reduce the feedback time by placing Epsilon 4 next to the production line
- Epsilon 4 Polymers plastics and paints
- Accurately analyse for additives and catalyst residues (ADPOL), toxic elements (TOXEL) and to ensure RoHS compliancy (RoHS)
... Read More | The 2830 ZT Wafer Analyzer is a wavelength dispersive X-ray fluorescence (WDXRF) offering measurement for film thickness and layer composition, dopant levels and surface uniformity of wafers up to 300 mm.
The 4 kW SST-mAX X-ray tube uses game changing ZETA Technology which eliminates the effects The 2830 ZT Wafer Analyzer is a wavelength dispersive X-ray fluorescence (WDXRF) offering measurement for film thickness and layer composition, dopant levels and surface uniformity of wafers up to 300 mm.
The 4 kW SST-mAX X-ray tube uses game changing ZETA Technology which eliminates the effects of X-ray tube aging, maintaining ‘new tube’ performance throughout the tube’s lifetime.... Read More | Zetium Metals Edition is capable of accurate elemental analysis on a wide variety of materials, from incoming raw materials through finished products. Included in this edition is a choice of 3 alloy application packages, or certification of 20 of your samples as standards. The system can be Zetium Metals Edition is capable of accurate elemental analysis on a wide variety of materials, from incoming raw materials through finished products. Included in this edition is a choice of 3 alloy application packages, or certification of 20 of your samples as standards. The system can be equipped to perform fast small spot mapping.
Smart Zetium:
We continuously strive to help you get the most out of our instruments, and we've connected the Zetium to our Smart Manager platform. This is a cloud-based 'control room' which provides you with a clear picture of the utilization and health of your instruments, wherever they are in the world. By connecting your Zetium to the Smart Manager, we have turned it into a Smart Zetium.... Read More |
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