X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.
Find, compare, and request a quote for XRF analyzers across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Hitachi High-Tech America, Inc. | Hitachi High-Tech America, Inc. | Hitachi High-Tech America, Inc. | Hitachi High-Tech America, Inc. |
| Item | LAB-X and X-Supreme Range Benchtop XRF elemental analysis | EA1000AIII and EA1400 Benchtop XRF analyzers for RoHS | FT160 Series | Vulcan Handheld LIBS Analyzer |
| Reviews | | | | |
| Catalog Number | LAB-X5000 / X-Supreme8000 | EA1000AIII / EA1400 | FT160 | Vulcan |
| Price | | | | |
| Principle | Inquire | X-ray Fluorescence | Inquire | Energy Dispersive X-Ray Fluorescence |
| X-Ray Tube | Inquire | (Rh target) Voltage: 15 kV, 40 kV, 50 kV | Current: 1 mA (10 µA to 1,000 µA variable) Bottom-Up method. | Inquire | Oxford Instruments' X-ray tube |
| Detector(s) | Inquire | Silicon PIN-diode or high resolution silicon-drift detector (SDD) | Inquire | Silicon-drift detector (SDD) |
| Analysis Diameter | Inquire | 1, 3, or 5 mm (programmable) | Inquire | Inquire |
| Description | XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 and LAB-X5000 for quality assurance and process control requirements across a diverse range of applications; e.g. Petroleum & oil, wood treatment, minerals,XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 and LAB-X5000 for quality assurance and process control requirements across a diverse range of applications; e.g. Petroleum & oil, wood treatment, minerals, mining, cosmetics, Cement, paper.
Features
- Results you can trust
- Low running costs
- Ruggedness built in
- Fast quality control
... Read More | Specifically designed for RoHS (Restriction of Hazardous Substances) the EA1000AIII and EA1400 benchtop XRF analyzers have been trusted for over 15 years to deliver consistent results for businesses who need to conform to this directive. With easy and quick measurement for RoHS you can ensure you Specifically designed for RoHS (Restriction of Hazardous Substances) the EA1000AIII and EA1400 benchtop XRF analyzers have been trusted for over 15 years to deliver consistent results for businesses who need to conform to this directive. With easy and quick measurement for RoHS you can ensure you will be able to meet the requirements for environmental regulations.
Features
- Easy to operate
- Optional 12-position carousel for unattended analysis
- Flexible calibrations to adapt to new RoHS standards
- Automatically highlights what you’re analyzing for glanceable results
- Quick measurement
- Large chamber to fit a variety of samples
- Visual and audio measurement indicator
- Option to add coatings and elemental analysis
... Read More | The FT160 benchtop XRF analyzer is designed to measure the minute features found on today’s PCBs, semiconductors, and micro-connectors. The ability to accurately and rapidly measure minute features helps to increase productivity and avoid costly rework or component rejection.
Features
The FT160 benchtop XRF analyzer is designed to measure the minute features found on today’s PCBs, semiconductors, and micro-connectors. The ability to accurately and rapidly measure minute features helps to increase productivity and avoid costly rework or component rejection.
Features
- Large observation window for viewing analysis from a safe distance
- Measurement methods meet standards ISO 3497, ASTM B568 and DIN 50987
- Test finishes for IPC-4552B, IPC-4553A, IPC-4554 and IPC-4556 conformity
- Automated feature location for fast sample setup
- Choice of analyzer configuration optimized for your application
- Measure nm-scale coatings on features smaller than 50 µm
- Double the analysis throughput of conventional instruments
- Accommodates large samples in a wide range of shapes
- Robust design tested for long-term production use
... Read More | Vulcan is a handheld LIBS (laser induced breakdown spectroscopy) analyzer, which allows users to perform rapid metal analysis. Whether your business is scrap sorting or PMI quality control, the Vulcan metal spectrometer delivers accurate and consistent grade ID every time.
Features
Vulcan is a handheld LIBS (laser induced breakdown spectroscopy) analyzer, which allows users to perform rapid metal analysis. Whether your business is scrap sorting or PMI quality control, the Vulcan metal spectrometer delivers accurate and consistent grade ID every time.
Features
- Simple to use
- Advanced data management
- Robust and durable
- Long battery life
... Read More |
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