X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.
Find, compare, and request a quote for XRF analyzers across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Hitachi High-Tech America, Inc. | Hitachi High-Tech America, Inc. | Hitachi High-Tech America, Inc. | Hitachi High-Tech America, Inc. |
| Item | EA1000AIII and EA1400 Benchtop XRF analyzers for RoHS | FT230 | LAB-X and X-Supreme Range Benchtop XRF elemental analysis | X-Strata920 EDXRF Spectrometer |
| Catalog Number | EA1000AIII / EA1400 | FT230 | LAB-X5000 / X-Supreme8000 | X-Strata920 |
| Price | | | | |
| Principle | X-ray Fluorescence | Inquire | Inquire | Energy Dispersive X-Ray Fluorescence |
| X-Ray Tube | (Rh target) Voltage: 15 kV, 40 kV, 50 kV | Current: 1 mA (10 µA to 1,000 µA variable) Bottom-Up method. | Tungsten (W) target microfocus X-ray tube, top-down orientation | Inquire | Inquire |
| Detector(s) | Silicon PIN-diode or high resolution silicon-drift detector (SDD) | Silicon drift detector (SDD) | Inquire | High-resolution silicon drift detector (SDD) |
| Analysis Diameter | 1, 3, or 5 mm (programmable) | Inquire | Inquire | Inquire |
| Description | Specifically designed for RoHS (Restriction of Hazardous Substances) the EA1000AIII and EA1400 benchtop XRF analyzers have been trusted for over 15 years to deliver consistent results for businesses who need to conform to this directive. With easy and quick measurement for RoHS you can ensure you Specifically designed for RoHS (Restriction of Hazardous Substances) the EA1000AIII and EA1400 benchtop XRF analyzers have been trusted for over 15 years to deliver consistent results for businesses who need to conform to this directive. With easy and quick measurement for RoHS you can ensure you will be able to meet the requirements for environmental regulations.
Features
- Easy to operate
- Optional 12-position carousel for unattended analysis
- Flexible calibrations to adapt to new RoHS standards
- Automatically highlights what you’re analyzing for glanceable results
- Quick measurement
- Large chamber to fit a variety of samples
- Visual and audio measurement indicator
- Option to add coatings and elemental analysis
... Read More | The FT230 is designed to simplify and accelerate testing of components and assemblies making it easier to measure more parts in less time. With features such as Find My Part™ smart recognition, automated sample focusing and a wide view camera, the FT230 reduces set up time and user error to increaseThe FT230 is designed to simplify and accelerate testing of components and assemblies making it easier to measure more parts in less time. With features such as Find My Part™ smart recognition, automated sample focusing and a wide view camera, the FT230 reduces set up time and user error to increase throughput and productivity. Let your XRF make decisions for you.
Features
- Automated focusing reduces sample loading time
- Find My Part™ smart recognition automatically sets the complete measurement routine
- Sample view is presented over a large part of the screen for excellent visibility
- Self-checking diagnostics confirms the health and stability of the instrument
- Integrates seamlessly with other software and easily exports data
- Intuitive and easy to use by non-specialists thanks to a new user interface
- Powerful to measure up to four layers at once plus the substrate
- Durable for a long-life in a challenging production or lab environment
- Conforms to ASTM B568 and DIN ISO 3497
- Helps you meet specifications for ENIG (IPC-4552B), ENEPIG (IPC-4556), immersion Sn (IPC-4554) and immersion Ag (IPC-4553A)
... Read More | XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 and LAB-X5000 for quality assurance and process control requirements across a diverse range of applications; e.g. Petroleum & oil, wood treatment, minerals,XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 and LAB-X5000 for quality assurance and process control requirements across a diverse range of applications; e.g. Petroleum & oil, wood treatment, minerals, mining, cosmetics, Cement, paper.
Features
- Results you can trust
- Low running costs
- Ruggedness built in
- Fast quality control
... Read More | The X-Strata920 is a high-precision benchtop XRF analyzer that comes with a huge range of options to accommodate many types of samples. Ideal for measuring coatings on a range of substrates, this analyzer is ideal for electronics, connectors, decorative items and jewelry analysis where product The X-Strata920 is a high-precision benchtop XRF analyzer that comes with a huge range of options to accommodate many types of samples. Ideal for measuring coatings on a range of substrates, this analyzer is ideal for electronics, connectors, decorative items and jewelry analysis where product quality must be established.
Features
- Adaptable design for reliable analysis of a wide range of products
- Automated focusing and optional motorized stage improves accuracy and speed
- Intuitive SmartLink software makes taking and exporting measurements easy
- Multi-collimator design for utmost accuracy for every sample
- Choice of proportional counter or silicon drift detector (SDD) to suit application
- Conforms to industry norms, such as IPC-4552A, ISO3497, ASTM B568 and DIN50987
- Easy sample loading and fast analysis delivers results in seconds
- Powerful optics to analyze single-layer and multi-layer coatings, including alloyed layers
... Read More |
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