X-Ray Fluorescence Spectrometer (XRF Analyzer)

X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.

Find, compare, and request a quote for XRF analyzers across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.

CompanyHitachi High-Tech America, Inc.Hitachi High-Tech America, Inc.Hitachi High-Tech America, Inc.Hitachi High-Tech America, Inc.Hitachi High-Tech America, Inc.
ItemFT230FT110AFT160 SeriesLAB-X and X-Supreme Range Benchtop XRF elemental analysisX-Strata920 EDXRF Spectrometer
Catalog NumberFT230FT110AFT160LAB-X5000 / X-Supreme8000X-Strata920
Price
PrincipleInquireXRF Coating Thickness GaugeInquireInquireEnergy Dispersive X-Ray Fluorescence
X-Ray TubeTungsten (W) target microfocus X-ray tube, top-down orientationAir-cooled small X-Ray TubeInquireInquireInquire
Detector(s)Silicon drift detector (SDD)Proportional counterInquireInquireHigh-resolution silicon drift detector (SDD)
DescriptionThe FT230 is designed to simplify and accelerate testing of components and assemblies making it easier to measure more parts in less time. With features such as Find My Part™ smart recognition, automated sample focusing and a wide view camera, the FT230 reduces set up time and user error to increase... Read MoreThe FT110A is a benchtop XRF analyzer designed to meet the challenges of in-production coatings analysis. Powerful X-ray fluorescence technology coupled with automated positioning functionality helps to increase productivity of plating shops while ensuring components meet the highest standards.

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The FT160 benchtop XRF analyzer is designed to measure the minute features found on today’s PCBs, semiconductors, and micro-connectors. The ability to accurately and rapidly measure minute features helps to increase productivity and avoid costly rework or component rejection.

Features
  • Large
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XRF analysis (X-ray fluorescence) with the highly flexible and powerful energy-dispersive X-ray fluorescence (EDXRF) spectrometer X-Supreme8000 and LAB-X5000 for quality assurance and process control requirements across a diverse range of applications; e.g. Petroleum & oil, wood treatment, minerals,... Read MoreThe X-Strata920 is a high-precision benchtop XRF analyzer that comes with a huge range of options to accommodate many types of samples. Ideal for measuring coatings on a range of substrates, this analyzer is ideal for electronics, connectors, decorative items and jewelry analysis where product ... Read More
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