X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.
Find, compare, and request a quote for XRF analyzers across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | ZSX Primus III NEXT High-Throughput/Affordable WDXRF Spectrometer | ZSX 400 Wavelength Dispersive X-ray Fluorescence Spectrometer | ZSX Primus IV Tube-above WDXRF Spectrometer |
| Catalog Number | ZSX Primus III NEXT | ZSX 400 | ZSX Primus IV |
| Price | | | |
| Principle | Wavelength dispersive | Wavelength Dispersive X-ray Fluorescence (WDXRF) | Wavelength Dispersive X-ray Fluorescence (WDXRF) |
| X-Ray Tube | End window type Rh target 3 kW | End window, Rh-anode, 3kW or 4 kW, 60kV | End window Rh-anode, 3kW or 4 kW |
| Goniometer Type | Inquire | Inquire | Inquire |
| Detector(s) | SC (Scintillation counter), F-PC (Gas flow proportional counter)
Optional: S-PC LE (Gas sealed proportional counter: does not require P-10 gas) | Heavy element detector - Scintillation counter (SC), Light element detector - Flow proportional counter (F-PC), Attenuator - In-out automatic exchanger (1/10) | SC Detector (heavy element), F-PC Detector (light element), 1/10 In-out automatic exchanger (Attenuator) |
| Analysis Diameter | Inquire | 30 to 0.5 mm | 0.5, 1, 10, 20, 30 and 35 mm |
| Description | Key Features
- High-end WDXRF – Ideal for industrial applications
- High throughput – Obtain accurate results in minutes
- Tube-above optics – Eliminates particulate contamination ensuring consistent, reliable results
- Extended detection rage – Be to Cm
- ZSX Guidance software – Increases usability
Key Features
- High-end WDXRF – Ideal for industrial applications
- High throughput – Obtain accurate results in minutes
- Tube-above optics – Eliminates particulate contamination ensuring consistent, reliable results
- Extended detection rage – Be to Cm
- ZSX Guidance software – Increases usability and assists with calibrations
- Attractive pricing - WDXRF performance at an affordable price
The ZSX Primus III NEXT provides rapid elemental analysis with the ability to rapidly quantify major and trace elements (Be to Cm). Its’ high-throughput, excellent sensitivity and affordable price point make it an ideal solution for industrial applications.
Tube-Above Optics
The system features Rigaku’s unique tube-above optical configuration which prevents dust and particles from contaminating optical components and distorting readings as well as minimizing maintenance and maximizing uptime. This makes it ideal for the analysis of pressed powder samples. Furthermore, using wavelength dispersive X-ray fluorescence (WDXRF) provides superior spectral resolution to energy dispersive X-ray fluorescence (EDXRF).
Improved Quality of Analytical results
The ZSX Primus III NEXT features a number of key upgrades from its predecessor resulting in improved results and high throughput levels. These include: - The incorporation of a digital multi-channel analyzer (D-MCA) and the efficient control of each driving unit to improve the quantitative analysis throughput by 21%.
- A S-PC LE, an environmentally friendly gas-shielded proportional detector for light elements. The S-PC LE negates the need to install a detector gas cylinder
- Powerful ZSX Guidance software, common to Rigaku’s flagship WDXRF spectrometers enabling data sharing and including scheduler function to automate and streamline operations
... Read More | Rigaku's unique ZSX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg weight, this system is ideal for analyzing sputtering targets, magneticRigaku's unique ZSX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg weight, this system is ideal for analyzing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples.
Customized sample adapter system
Having the versatility to adapt to your specific sample types and analysis needs, the ZSX 400 is adaptable to various sample sizes and shapes using optional (made to order) adapter inserts. With a variable measurement spot (30 mm to 0.5 mm diameter with 5-step automatic selection) and mapping capability with multi-point measurements to check for sample uniformity, this uniquely flexible instrument can dramatically streamline your quality control processes.
Sample view camera with special lighting
Optional real-time camera allows the analysis point to be viewed on screen. The operator has complete certainty as to what is being measured.
Traditional WDXRF analytical capabilities
All analytical capabilities of a traditional instrument are retained in this "large sample" variant. Analyze beryllium (Be) through uranium (U) with high-resolution, high-precision WDXRF spectroscopy, from solids to liquids and powders to thin films. Analyze wide composition ranges (ppm to tens of percent) and thicknesses (sub Å to mm). Optionally available is diffraction peak interference rejection, for optimal results for single-crystal substrates. The Rigaku ZSX 400 complies with industry standards SEMI and CE.
Features - Large sample analysis
- Up to 400 mm (diameter)
- Up to 50 mm (thickness)
- Up to 30 kg (mass)
- Sample adapter system
- Adaptable to various sample sizes
- Measurement spot
- 30 mm to 0.5 mm diameter
- 5-step automatic selection
- Mapping capability
- Allows multipoint measurements
- Sample view camera (option)
- General purpose
- Analyze Be - U
- Elemental range: ppm to %
- Thickness range: sub Å to mm
- Diffraction interference rejection (option)
- Accurate results for single-crystal substrates
- Compliance with industry standards
- Small footprint
50% footprint of the previous model ... Read More | As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:- Analysis of elements from Be to U
- ZSX Guidance expert system software
- Digital multi-channel analyzer (D-MCA)
- EZ Analysis interface for routine measurements
- Tube above optics minimizes contamination issues
- Small footprint uses less valuable lab space
- Micro analysis to analyze samples as small as 500 µm
- 30µ tube delivers superior light element performance
- Mapping feature for elemental topography/distribution
- Helium seal means the optics are always under vacuum
... Read More |
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