X-Ray Fluorescence Spectrometer (XRF Analyzer)

X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.

Find, compare, and request a quote for XRF analyzers across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.

CompanyMalvern PanalyticalMalvern PanalyticalMalvern PanalyticalMalvern Panalytical
Item2830 ZT WDXRF Wafer AnalyzerAxios FAST Simultaneous XRF SpectrometerEpsilon Xflow On-line XRF AnalyzerRevontium™ Compact XRF Analyzer
Citations
(2)
Catalog Number2830 ZTAxios FASTRevontium
Price
PrincipleWavelength Dispersive X-ray FluorescenceWavelength Dispersive X-ray FluorescenceEDXRFED-XRF
X-Ray Tube4 kW SST-mAX X-ray Tube (Super Sharp X-ray Tube)Super Sharp X-ray Tube (SST), up to 4 kW, 60 kV and 125 mA15 W X-ray tube(Excitation) 4 to 60 kV
Very low drift because of zero-evaporation technology advancement (ZETA)
Goniometer TypeInquireInquireN/AInquire
Detector(s)Hi-Per Scint Detector, Duplex DetectorHi-Per Scint Detector, Duplex DetectorHigh-resolution SDD (silicon drift detector)4 x High-resolution silicon-drift detectors (SDD)
Analysis Diameterup to 300 mmInquireInquire27 mm
DescriptionThe 2830 ZT Wafer Analyzer is a wavelength dispersive X-ray fluorescence (WDXRF) offering measurement for film thickness and layer composition, dopant levels and surface uniformity of wafers up to 300 mm.

The 4 kW SST-mAX X-ray tube uses game changing ZETA Technology which eliminates the effects
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When there is a need for speed, the Axios FAST simultaneous XRF spectrometer allows simultaneous fixed-channel measurements of up to 28 elements, giving very rapid routine analysis for real-time process control.

Features

High throughput
With fast sample handling and outstanding reliability,
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InquireRevontium™ is a compact X-ray fluorescence (XRF) spectrometer that delivers high-quality elemental analysis in a compact, tabletop format. It bridges the performance of floor-standing XRF and the versatility of table-top instruments. Compact XRF offers a smaller physical and environmental footprint.... Read More
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