| X-Ray Tube | No-drift SST R-mAX tube | 4 kW SST-mAX X-ray Tube (Super Sharp X-ray Tube) | Super Sharp X-ray Tube (SST), up to 4 kW, 60 kV and 125 mA | Metal-ceramic side window for maximum stability, 50 micrometers thin beryllium window for high sensitivity for light elements, Ag anode X-ray tube for best performance of P, S and Cl analysis |
| Detector(s) | Hi-Per Scint Detector, Duplex Detector | Hi-Per Scint Detector, Duplex Detector | Hi-Per Scint Detector, Duplex Detector | High-resolution silicon drift detector (SDD) |
| Description | Zetium Metals Edition is capable of accurate elemental analysis on a wide variety of materials, from incoming raw materials through finished products. Included in this edition is a choice of 3 alloy application packages, or certification of 20 of your samples as standards. The system can be Zetium Metals Edition is capable of accurate elemental analysis on a wide variety of materials, from incoming raw materials through finished products. Included in this edition is a choice of 3 alloy application packages, or certification of 20 of your samples as standards. The system can be equipped to perform fast small spot mapping.
Smart Zetium:
We continuously strive to help you get the most out of our instruments, and we've connected the Zetium to our Smart Manager platform. This is a cloud-based 'control room' which provides you with a clear picture of the utilization and health of your instruments, wherever they are in the world. By connecting your Zetium to the Smart Manager, we have turned it into a Smart Zetium.... Read More | The 2830 ZT Wafer Analyzer is a wavelength dispersive X-ray fluorescence (WDXRF) offering measurement for film thickness and layer composition, dopant levels and surface uniformity of wafers up to 300 mm.
The 4 kW SST-mAX X-ray tube uses game changing ZETA Technology which eliminates the effects The 2830 ZT Wafer Analyzer is a wavelength dispersive X-ray fluorescence (WDXRF) offering measurement for film thickness and layer composition, dopant levels and surface uniformity of wafers up to 300 mm.
The 4 kW SST-mAX X-ray tube uses game changing ZETA Technology which eliminates the effects of X-ray tube aging, maintaining ‘new tube’ performance throughout the tube’s lifetime.... Read More | When there is a need for speed, the Axios FAST simultaneous XRF spectrometer allows simultaneous fixed-channel measurements of up to 28 elements, giving very rapid routine analysis for real-time process control.
Features
High throughput
With fast sample handling and outstanding reliability, When there is a need for speed, the Axios FAST simultaneous XRF spectrometer allows simultaneous fixed-channel measurements of up to 28 elements, giving very rapid routine analysis for real-time process control.
Features
High throughput
With fast sample handling and outstanding reliability, the Axios FAST simultaneous XRF spectrometer is the choice for high-speed analytical control. The sample loading turret mechanism ensures high throughput - new samples can be introduced even while a measurement is in progress. An optional sample changer allows unattended batch analysis.
Extended analysis
Axios FAST also addresses additional analytical requirements - it can be fitted with up to four programmable goniometers, which can run simultaneously, giving extra flexibility to a dedicated fixed channel configuration.
ZETA Technology
The Axios FAST spectrometer is equipped with PANalytical’s advanced SST-mAX X-ray tube. SST-mAX features groundbreaking ZETA Technology, which eliminates the effects of X-ray tube aging – by far the largest contributor to instrument drift especially for light elements. This ensures that ‘new tube’ performance is maintained throughout the tube’s lifetime and there is no need for recalibration over long periods of time. Together with the 4 kW output this results in maintaining the highest sensitivities and lowest detection limits for light elements over time.
Unrivalled productivity, minimum downtime
Axios FAST includes many features designed to allow optimum control of all components and ease of maintenance. For example, measuring channels are mounted externally on a compact measuring chamber, enabling simple access for routine maintenance, addition or removal of channels and initial alignment.
Global support
At PANalytical, customer satisfaction has our highest priority. Axios FAST is equipped with extensive self-monitoring facilities for remote diagnostics which, combined with PANalytical’s global support and maintenance network, guarantees rapid service assistance, wherever the location.
Made for automation
Axios FAST’s dedicated software and hardware interfaces allow flexible connection to sample transport devices and host computers, for fully automated analysis. Axios FAST is also the basis of the TEAMworks (Total Element Analyzing Module) solution.
Proven and dedicated software
Axios FAST operates using the latest version of PANalytical’s proven SuperQ XRF software, renowned for its highly intuitive interface and menu. Even inexperienced personnel can carry out routine analysis with a minimum of instruction.... Read More | The Epsilon 4 is a multi-functional instrument for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection technologies with mature software and smart design, the analytical The Epsilon 4 is a multi-functional instrument for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection technologies with mature software and smart design, the analytical performance of Epsilon 4 approaches that of more powerful and floor-standing XRF spectrometers.
Industry-specific editions are available: - Epsilon 4 Mining and minerals
- At-line elemental analysis directly in the mine or next to the production line.
- Epsilon 4 Oils and fuels
- Comply with EPA TIER 3 and ISO 13032 for analyzing sulfur in fuels and oils.
- Epsilon 4 Lubricating oils
- Comply with ASTM D7751-15 for analyzing additives in lubricating oils.
- Epsilon 4 Pharmaceuticals and cosmetics
- Comply with ICH Q3D, USP <232>, <233> and <735> for trace element analysis of impurities in excipients and API.
- Epsilon 4 Food and environment
- Comply with EPA IO-3.3 for air filter analysis and ISO 18227, ISO 15309 and ASTM C1255 for soils analysis.
- Epsilon 4 Building materials
- Comply with ASTM C114-15 and reduce the feedback time by placing Epsilon 4 next to the production line
- Epsilon 4 Polymers plastics and paints
- Accurately analyse for additives and catalyst residues (ADPOL), toxic elements (TOXEL) and to ensure RoHS compliancy (RoHS)
... Read More |