X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.
Find, compare, and request a quote for XRF analyzers across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | ZSX Primus IV Tube-above WDXRF Spectrometer | NANOHUNTER II Benchtop TXRF Spectrometer | NEX QC II Series EDXRF Spectrometers |
| Catalog Number | ZSX Primus IV | | NEX QC II |
| Price | | | |
| Principle | Wavelength Dispersive X-ray Fluorescence (WDXRF) | TXRF | Energy Dispersive X-ray Fluorescence (EDXRF) |
| X-Ray Tube | End window Rh-anode, 3kW or 4 kW | Mo anode, 600W | End window transmission with Ag anode, 50 kV 4 W, 6 tube filters |
| Goniometer Type | Inquire | N/A | Inquire |
| Detector(s) | SC Detector (heavy element), F-PC Detector (light element), 1/10 In-out automatic exchanger (Attenuator) | Silicon drift detector (SDD) | High-performance silicon drift detectors |
| Analysis Diameter | 0.5, 1, 10, 20, 30 and 35 mm | N/A | Inquire |
| Description | As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:- Analysis of elements from Be to U
- ZSX Guidance expert system software
- Digital multi-channel analyzer (D-MCA)
- EZ Analysis interface for routine measurements
- Tube above optics minimizes contamination issues
- Small footprint uses less valuable lab space
- Micro analysis to analyze samples as small as 500 µm
- 30µ tube delivers superior light element performance
- Mapping feature for elemental topography/distribution
- Helium seal means the optics are always under vacuum
... Read More | Inquire | Fast, non-destructive elemental testing made simple
The NEX QC II Series simplifies routine quality control and elemental testing. These compact benchtop EDXRF analyzers deliver fast results for solids, liquids, powders, and thin films—ideal for everyday quality control in labs, plants, and Fast, non-destructive elemental testing made simple
The NEX QC II Series simplifies routine quality control and elemental testing. These compact benchtop EDXRF analyzers deliver fast results for solids, liquids, powders, and thin films—ideal for everyday quality control in labs, plants, and production environments. Designed for ease of use, the NEX QC II and NEX QC II+ feature intuitive operation with an embedded computer and built-in printer, so your team can get results quickly with no specialized technical background required. The first-generation NEX QC+ QuantEZ remains available for users who require expanded method development, advanced calibration strategies, and optional compliance features, including 21 CFR Part 11 support.
Features:
- Rapid, non-destructive elemental analysis
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Multi-element capabilities, from ppm to percent levels
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Measurement of all elements from sodium (Na) to uranium (U)
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Multi-application versatility, including solids, liquids, alloys, powders, and thin films
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50 kV X-ray tube for wide elemental coverage
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High-performance silicon drift detectors
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Multiple automated tube filters for enhanced sensitivity
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Easy-to-use software with multilingual user interface
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Compact, space-saving design
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Easy sample preparation and no complex setups
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Low cost of ownership, self-installed and maintained
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Various options, including autosampler and carrying case
... Read More |
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