X-Ray Fluorescence Spectrometer (XRF Analyzer)

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X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.
CompanyHitachi High-Tech America, Inc.Hitachi High-Tech America, Inc.Hitachi High-Tech America, Inc.Hitachi High-Tech America, Inc.Hitachi High-Tech America, Inc.
ItemFT160 SeriesEA1000AIII and EA1400 Benchtop XRF analyzers for RoHSEA8000A: X-ray Particle Contaminant Analyzer for Lithium-ion Battery ProductionFT110AX-Strata920 EDXRF Spectrometer
Catalog NumberFT160EA1000AIII / EA1400EA8000AFT110AX-Strata920
Price
PrincipleInquireX-ray FluorescenceTransmission X-ray imaging and X-ray fluorescence spectroscopyXRF Coating Thickness GaugeEnergy Dispersive X-Ray Fluorescence
X-Ray TubeInquire(Rh target) Voltage: 15 kV, 40 kV, 50 kV | Current: 1 mA (10 µA to 1,000 µA variable) Bottom-Up method.XRF Analyzer - Small Air-cooled X-ray tube
X-ray transmission - Water-cooled X-ray tube
Air-cooled small X-Ray TubeInquire
Detector(s)InquireSilicon PIN-diode or high resolution silicon-drift detector (SDD)High Resolution SDDProportional counterHigh-resolution silicon drift detector (SDD)
Analysis DiameterInquire1, 3, or 5 mm (programmable)InquireInquireInquire
DescriptionThe FT160 benchtop XRF analyzer is designed to measure the minute features found on today’s PCBs, semiconductors, and micro-connectors. The ability to accurately and rapidly measure minute features helps to increase productivity and avoid costly rework or component rejection.

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Specifically designed for RoHS (Restriction of Hazardous Substances) the EA1000AIII and EA1400 benchtop XRF analyzers have been trusted for over 15 years to deliver consistent results for businesses who need to conform to this directive. With easy and quick measurement for RoHS you can ensure you ... Read MoreThe EA8000 X-ray analyzer for fast and efficient quality control in lithium-ion battery production. Combining X-ray transmission imaging with X-ray fluorescence analysis in a single instrument, the EA8000 rapidly detects and identifies metals contaminants that are so detrimental to lithium-ion ... Read MoreThe FT110A is a benchtop XRF analyzer designed to meet the challenges of in-production coatings analysis. Powerful X-ray fluorescence technology coupled with automated positioning functionality helps to increase productivity of plating shops while ensuring components meet the highest standards.

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The X-Strata920 is a high-precision benchtop XRF analyzer that comes with a huge range of options to accommodate many types of samples. Ideal for measuring coatings on a range of substrates, this analyzer is ideal for electronics, connectors, decorative items and jewelry analysis where product ... Read More
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