X-Ray Fluorescence Spectrometer (XRF Analyzer)

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X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.
CompanyMalvern PanalyticalMalvern PanalyticalMalvern PanalyticalMalvern PanalyticalMalvern Panalytical
ItemAxios FAST Simultaneous XRF Spectrometer2830 ZT WDXRF Wafer AnalyzerZetium Metals EditionZetium Minerals EditionZetium Ultimate Edition
Citations
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Catalog NumberAxios FAST2830 ZTZetium Metals EditionZetium Minerals EditionZetium Ultimate Edition
Price
PrincipleWavelength Dispersive X-ray FluorescenceWavelength Dispersive X-ray FluorescenceWavelength AND Energy Dispersive Dispersive X-ray FluorescenceWavelength Dispersive X-ray FluorescenceWavelength AND Energy Dispersive Dispersive X-ray Fluorescence
X-Ray TubeSuper Sharp X-ray Tube (SST), up to 4 kW, 60 kV and 125 mA4 kW SST-mAX X-ray Tube (Super Sharp X-ray Tube)No-drift SST R-mAX tubeSuper-sharp SST R-mAX X-ray tubesNo-drift SST R-mAX 4 kW X-ray tube, 50 micron window
Goniometer TypeInquireInquireInquireInquireInquire
Detector(s)Hi-Per Scint Detector, Duplex DetectorHi-Per Scint Detector, Duplex DetectorHi-Per Scint Detector, Duplex DetectorInquireDuplex detector
Analysis DiameterInquireup to 300 mmInquireInquireInquire
DescriptionWhen there is a need for speed, the Axios FAST simultaneous XRF spectrometer allows simultaneous fixed-channel measurements of up to 28 elements, giving very rapid routine analysis for real-time process control.

Features

High throughput
With fast sample handling and outstanding reliability,
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The 2830 ZT Wafer Analyzer is a wavelength dispersive X-ray fluorescence (WDXRF) offering measurement for film thickness and layer composition, dopant levels and surface uniformity of wafers up to 300 mm.

The 4 kW SST-mAX X-ray tube uses game changing ZETA Technology which eliminates the effects
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Zetium Metals Edition is capable of accurate elemental analysis on a wide variety of materials, from incoming raw materials through finished products. Included in this edition is a choice of 3 alloy application packages, or certification of 20 of your samples as standards. The system can be ... Read MoreThe Zetium Minerals Edition XRF Spectrometer is well suited for materials analysis at all stages of mining. It is pre-configured to cover a wide range of elements at concentrations from ppm to 100%. A new faster sample changer, certification of 20 in-house samples as standards, and Virtual ... Read MoreThe Zetium Ultimate edition XRF spectrometer is the most advanced configuration in the Zetium family. The combination of WD and ED core and advanced technologies delivers analytical excellence in every situation, from R&D labs to high-throughput production. The Ultimate edition is pre-configured to... Read More
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