| Description | Incorporating a high-performance semiconductor detector, the EDX-8100 spectrometer offers excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research.
The EDX-8100 system's state-of-the-art semiconductor detector Incorporating a high-performance semiconductor detector, the EDX-8100 spectrometer offers excellent sensitivity, resolution, and throughput for an array of applications, from general screening analysis to advanced materials research.
The EDX-8100 system's state-of-the-art semiconductor detector (SDD) offers a high fluorescent X-ray count per unit time. This enables precise, high-resolution analysis while increasing throughput, allowing researchers and labs to increase their productivity without sacrificing accuracy. The detectoralso has a special ultra-thin-film window material that is able to detect ultra-light elements such as carbon (C), oxygen (O), and fluorine (F). In addition, since it is electronically cooled, the SDD does not require liquid nitrogen, reducing both operating costs and maintenance requirements.
Additional features include: - Measurement range of 6C to 92U (EDX-8100)
- Five primary filters – enable highly sensitive analysis of trace elements
- Sample observation camera
- Large sample chamber – accommodates virtually any sample type
PCEDX Navi operating software features a simple but refined user interface, and offers intuitive operation, easy instrument initialization and startup, and a variety of report formats. A variety of optional equipment, including a vacuum measurement unit, helium purge unit, and screening analysis kit, is available to address specific applications.... Read More | The EDX-7200 is a flagship model of the EDX series in pursuit of high sensitivity, high speed and high precision. This model supports new regulations and directives for consumer and environmental compliance, such as RoHS/ELV, REACH, and TSCA with full exclusive screening analysis kits. The EDX-7200 The EDX-7200 is a flagship model of the EDX series in pursuit of high sensitivity, high speed and high precision. This model supports new regulations and directives for consumer and environmental compliance, such as RoHS/ELV, REACH, and TSCA with full exclusive screening analysis kits. The EDX-7200 is equipped with a high-resolution SDD detector to achieve a higher count rate and detection efficiency.
Key features:
- High-count-rate SDD and a high-speed circuit – achieves highly precise analysis of the target in a shorter measurement time
- Superior energy resolution that reduces the effects of overlapping peaks of different elements
- Large sample chamber accommodates all types of samples – from small to large, from solids to powders to liquids
- Automatic measurement time reduction function automatically switches to the next analysis channel if a controlled substance clearly has a high or low concentration, making evaluation possible while measurement is underway.
- Four-stage automatic collimator switching capability
- Included sample observation camera
- Optional screening analysis kits available – RoHS, Halogen, and Antimony Screening
- Analysis Kit, Phosphorus Screening Analysis Kit, and Tin Screening Analysis Kit.
- Options include a vacuum measurement unit, helium purge unit for highly sensitive measurement of light elements, and a 12-sample turret for automated continuous measurements.
PCEDX Navi software simplifies X-ray fluorescence spectrometry for beginners, while providing the feature set and capabilities demanded by more experienced users. The straightforward user interface offers intuitive operation and provides a convenient operating environment for uses regardless of expertise level.... Read More | The EDX-LE is an energy dispersive X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. Its detector (Si-PIN semiconductor detector) does not require liquid nitrogen, thereby achieving lower operational costs and easier maintenance. AutomatedThe EDX-LE is an energy dispersive X-ray fluorescence spectrometer designed specifically for screening elements regulated by RoHS/ELV directives. Its detector (Si-PIN semiconductor detector) does not require liquid nitrogen, thereby achieving lower operational costs and easier maintenance. Automated analysis functions improve operability without sacrificing its high level of inspection reliability.
The time required from start of measurement to judgment is as short as one minute for some samples, which is very helpful in screening inspections for elements regulated by the RoHS directive.
Features
- Exceptional labor savings, high-speed screening
- Lower operational costs, easier maintenance
- Provides specific functions for screening the five RoHS regulated elements
- Easy set-up functions can be customized according to the management method
- Easily carry out difficult tasks
- Easy operation from the [Screening Analysis] window
- All steps are automatically set, from the evaluation of major components to selection of conditions
- All necessary functions are provided
- Functions necessary for RoHS/ELV analysis are provided as standard
- A large sample chamber enables measurements of large samples
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