X-Ray Fluorescence Spectrometer (XRF Analyzer)

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X-ray fluorescence spectrometers use high-energy X-rays (or gamma rays) to excite fluorescent radiation from a sample for quantitative chemical or elemental analysis and have many industrial and research applications. Elements with an excitation energy less than the x-ray beam fluoresce and can be counted by a wavelength-dispersive or energy-dispersive spectrometer. The advantages of X-ray fluorescence spectrometers are that there is no need for sample prep (the material can simply be placed in the beam), and that it is a non-destructive analysis technique. This is ideal for fields like archeology, where destructive analytical methods are not an option. X-ray spectrometers are also gaining importance in response to increasing demand for lead testing in consumer products. Speed and sensitivity are prime considerations in choosing an X-ray fluorescence spectrometer. Ease of use and good analytical software are also important.
CompanyMalvern PanalyticalMalvern PanalyticalMalvern PanalyticalMalvern PanalyticalMalvern Panalytical
ItemZetium Cement Edition2830 ZT WDXRF Wafer AnalyzerAxios FAST Simultaneous XRF SpectrometerEpsilon 1 ISO 13032 XRF SpectrometerEpsilon 4 XRF Spectrometer for Elemental Analysis
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Catalog NumberZetium Cement Edition2830 ZTAxios FASTEpsilon 1 ISO 13032Epsilon 4
Price
PrincipleWavelength Dispersive X-ray FluorescenceWavelength Dispersive X-ray FluorescenceWavelength Dispersive X-ray FluorescenceInquireEnergy Dispersive X-ray Fluorescence
X-Ray Tube3.0 kW SST R Ag Tube4 kW SST-mAX X-ray Tube (Super Sharp X-ray Tube)Super Sharp X-ray Tube (SST), up to 4 kW, 60 kV and 125 mAHigh-stability ceramic side window; 50 micrometer thin window (Be); Vanadium anode; ideal for sulfur and chlorine analysis; Software-controlled, max voltage 30 kVMetal-ceramic side window for maximum stability, 50 micrometers thin beryllium window for high sensitivity for light elements, Ag anode X-ray tube for best performance of P, S and Cl analysis
Goniometer TypeInquireInquireInquireInquireInquire
Detector(s)InquireHi-Per Scint Detector, Duplex DetectorHi-Per Scint Detector, Duplex DetectorHigh-resolution, typical 135 eV, 8 micrometer thin window (Be), high count-rate capacityHigh-resolution silicon drift detector (SDD)
Analysis DiameterInquireup to 300 mmInquireInquireInquire
DescriptionThe Zetium Cement edition XRF spectrometer is a multipurpose analytical tool for cement materials at all stages of the production process. In addition to being a fully-fledged XRF spectrometer, the Cement edition is equipped with our unique THETA quantification system for free lime. THETA analyzes ... Read MoreThe 2830 ZT Wafer Analyzer is a wavelength dispersive X-ray fluorescence (WDXRF) offering measurement for film thickness and layer composition, dopant levels and surface uniformity of wafers up to 300 mm.

The 4 kW SST-mAX X-ray tube uses game changing ZETA Technology which eliminates the effects
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When there is a need for speed, the Axios FAST simultaneous XRF spectrometer allows simultaneous fixed-channel measurements of up to 28 elements, giving very rapid routine analysis for real-time process control.

Features

High throughput
With fast sample handling and outstanding reliability,
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Epsilon 1 is the ideal analytical solution. The instrument is pre-calibrated in the factory and is an out-of-the-box solution for the analysis of low sulfur content in fuels in compliance with ISO 13032.

Epsilon 1 gives you precise and accurate data with minimal sample preparation and no need
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The Epsilon 4 is a multi-functional instrument for any industry segment needing elemental analysis from fluorine (F) to americium (Am) in areas from R&D through to process control. Combining the latest excitation and detection technologies with mature software and smart design, the analytical ... Read More
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