X-Ray Fluorescence spectrometers (XRF) use high energy X-rays (or gamma rays) to excite fluorescent radiation or photons from a sample for elemental analysis. In wavelength dispersive x-ray fluorescence spectroscopy (WDXRF), photons emitted by the sample are separated or dispersed by diffraction before hitting the detector. This is accomplished by placing an analyzing crystal between the sample and the detector. Therefore, WDXRF spectrometers have better resolution than energy dispersive x-ray fluorescence spectrometers which do not contain an analyzing crystal. However, due to the increase in optical components, WDXRF spectrometers typical have a lower efficiency than EDXRF spectrometers and, hence, require a higher power x-ray tube (which can add to the cost of the instrument).
There are two types of WDXRF spectrometers: simultaneous and sequential. In simultaneous WDXRF spectrometers, multiple detectors placed at different angles are used to analyze multiple elements simultaneously. In sequential WDXRF Spectrometers, the crystal is turned while elements are analyzed sequentially. Sequential WDXRF spectrometers typically have better intensity, but take longer to record measurements. WDXRF is a nondestructive technique and has applications in many industries where elemental analysis is needed, such as geoscience, environmental analysis, food safety, and analyzing archeological artifacts.
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Energy Dispersive XRF Spectrometers (EDXRF)
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| Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
| Item | ZSX Primus III NEXT – High-Throughput/Affordable WDXRF Spectrometer | Simultix 15 Simultaneous WDXRF Spectrometer System | ZSX 400 Wavelength Dispersive X-ray Fluorescence Spectrometer | ZSX Primus IV Tube-above WDXRF Spectrometer | ZSX Primus IVi – High Power Sequential WDXRF Spectrometer |
| Catalog Number | ZSX Primus III NEXT | | ZSX 400 | ZSX Primus IV | ZSX Primus IVi |
| Price | | | | | |
| Principle | Wavelength dispersive | Inquire | Wavelength Dispersive X-ray Fluorescence (WDXRF) | Wavelength Dispersive X-ray Fluorescence (WDXRF) | Inquire |
| X-Ray Tube | End window type Rh target 3 kW | End window, Rh-anode, 4kw, 60 kv | End window, Rh-anode, 3kW or 4 kW, 60kV | End window Rh-anode, 3kW or 4 kW | Inquire |
| Goniometer Type | Inquire | Inquire | Inquire | Inquire | Inquire |
| Detector(s) | SC (Scintillation counter), F-PC (Gas flow proportional counter)
Optional: S-PC LE (Gas sealed proportional counter: does not require P-10 gas) | Scintillation counter (SC), Sealed proportioonal counter (S-PC), Flow proportional counter (F-PC) | Heavy element detector - Scintillation counter (SC), Light element detector - Flow proportional counter (F-PC), Attenuator - In-out automatic exchanger (1/10) | SC Detector (heavy element), F-PC Detector (light element), 1/10 In-out automatic exchanger (Attenuator) | Inquire |
| Analysis Diameter | Inquire | Inquire | 30 to 0.5 mm | 0.5, 1, 10, 20, 30 and 35 mm | Inquire |
| Description | Key Features
- High-end WDXRF – Ideal for industrial applications
- High throughput – Obtain accurate results in minutes
- Tube-above optics – Eliminates particulate contamination ensuring consistent, reliable results
- Extended detection rage – Be to Cm
- ZSX Guidance software – Increases usability
Key Features
- High-end WDXRF – Ideal for industrial applications
- High throughput – Obtain accurate results in minutes
- Tube-above optics – Eliminates particulate contamination ensuring consistent, reliable results
- Extended detection rage – Be to Cm
- ZSX Guidance software – Increases usability and assists with calibrations
- Attractive pricing - WDXRF performance at an affordable price
The ZSX Primus III NEXT provides rapid elemental analysis with the ability to rapidly quantify major and trace elements (Be to Cm). Its’ high-throughput, excellent sensitivity and affordable price point make it an ideal solution for industrial applications.
Tube-Above Optics
The system features Rigaku’s unique tube-above optical configuration which prevents dust and particles from contaminating optical components and distorting readings as well as minimizing maintenance and maximizing uptime. This makes it ideal for the analysis of pressed powder samples. Furthermore, using wavelength dispersive X-ray fluorescence (WDXRF) provides superior spectral resolution to energy dispersive X-ray fluorescence (EDXRF).
Improved Quality of Analytical results
The ZSX Primus III NEXT features a number of key upgrades from its predecessor resulting in improved results and high throughput levels. These include:
- The incorporation of a digital multi-channel analyzer (D-MCA) and the efficient control of each driving unit to improve the quantitative analysis throughput by 21%.
- A S-PC LE, an environmentally friendly gas-shielded proportional detector for light elements. The S-PC LE negates the need to install a detector gas cylinder
- Powerful ZSX Guidance software, common to Rigaku’s flagship WDXRF spectrometers enabling data sharing and including scheduler function to automate and streamline operations
... Read More | For over 40 years, the Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analytical tool for process control in industries that require high throughput and precision, such as steel and cement. Nearly 1,000 Simultix For over 40 years, the Rigaku Simultix simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analytical tool for process control in industries that require high throughput and precision, such as steel and cement. Nearly 1,000 Simultix XRF instruments have been delivered to customers around the world. Along with technological progress over these years, customer requirements have advanced and diversified as well. Simultix 15 WDXRF elemental analyzer was developed to meet these changing needs. It offers significantly improved performance, functions, and usability. The compact and intelligent Simultix 15 is a powerful analytical tool for elemental analysis that demonstrates superior performance across many industrial sectors.... Read More | Rigaku's unique ZSX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg weight, this system is ideal for analyzing sputtering targets, magneticRigaku's unique ZSX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg weight, this system is ideal for analyzing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples.
Customized sample adapter system
Having the versatility to adapt to your specific sample types and analysis needs, the ZSX 400 is adaptable to various sample sizes and shapes using optional (made to order) adapter inserts. With a variable measurement spot (30 mm to 0.5 mm diameter with 5-step automatic selection) and mapping capability with multi-point measurements to check for sample uniformity, this uniquely flexible instrument can dramatically streamline your quality control processes.
Sample view camera with special lighting
Optional real-time camera allows the analysis point to be viewed on screen. The operator has complete certainty as to what is being measured.
Traditional WDXRF analytical capabilities
All analytical capabilities of a traditional instrument are retained in this "large sample" variant. Analyze beryllium (Be) through uranium (U) with high-resolution, high-precision WDXRF spectroscopy, from solids to liquids and powders to thin films. Analyze wide composition ranges (ppm to tens of percent) and thicknesses (sub Å to mm). Optionally available is diffraction peak interference rejection, for optimal results for single-crystal substrates. The Rigaku ZSX 400 complies with industry standards SEMI and CE.
Features
- Large sample analysis
- Up to 400 mm (diameter)
- Up to 50 mm (thickness)
- Up to 30 kg (mass)
- Sample adapter system
- Adaptable to various sample sizes
- Measurement spot
- 30 mm to 0.5 mm diameter
- 5-step automatic selection
- Mapping capability
- Allows multipoint measurements
- Sample view camera (option)
- General purpose
- Analyze Be - U
- Elemental range: ppm to %
- Thickness range: sub Å to mm
- Diffraction interference rejection (option)
- Accurate results for single-crystal substrates
- Compliance with industry standards
- Small footprint
50% footprint of the previous model ... Read More | As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
Features:- Analysis of elements from Be to U
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ZSX Guidance expert system software
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Digital multi-channel analyzer (D-MCA)
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EZ Analysis interface for routine measurements
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Tube above optics minimizes contamination issues
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Small footprint uses less valuable lab space
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Micro analysis to analyze samples as small as 500 µm
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30µ tube delivers superior light element performance
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Mapping feature for elemental topography/distribution
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Helium seal means the optics are always under vacuum
... Read More | Inquire |
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