In Raman microscopy, also called confocal Raman microscopy, an optical microscope and a Raman spectrometer are combined into one instrument in order to provide high resolution images of small samples. This high resolution imaging has applications that include materials science, earth science, cell biology, medicine, cosmetics, and art analysis.
A Raman microscope consists of a basic optical microscope, a Raman spectrometer, a laser, a light source, and a detector such as a CCD camera. The optical microscope uses light to magnify and identify samples while the Raman spectrometer scatters light and measures the excitation vibration. When selecting a microscope, it is important to consider the qualities of each of the microscope's components and their optimal configuration for a particular application.
Find, compare, and request a quote for Raman and confocal Raman microscopes across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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| Company | Oxford Instruments | Oxford Instruments | Oxford Instruments | Oxford Instruments | Oxford Instruments |
| Item | witec360 Raman Microscope | ParticleScout – Raman-based Particle Analysis | RISE Microscopy – Raman Imaging-SEM | TrueSurface – Topographic Raman Imaging | witec360 Semiconductor Edition Raman Microscope |
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| Catalog Number | witec360 | ParticleScout™ | RISE™ Microscopy | TrueSurface™ | |
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| Description | The witec360 Raman microscope features all the performance and versatility of the WITec alpha300 series while enhancing light transmission and automation, and encompassing standard and inverted beam versions, dedicated and correlative configurations, and systems with varying levels of automation.
The witec360 Raman microscope features all the performance and versatility of the WITec alpha300 series while enhancing light transmission and automation, and encompassing standard and inverted beam versions, dedicated and correlative configurations, and systems with varying levels of automation.
The Hexalight spectrometer offers unprecedented throughput from 350 to 1100 nanometres and a revolutionary harmonic drive that positions up to six gratings with a new degree of precision. With the witec360 Raman microscope, it constitutes the most advanced confocal Raman imaging system yet devised.
Researchers from principal investigators to industry scientists and core lab managers can benefit from the witec360.... Read More | ParticleScout is an advanced particle analysis tool for witec360 Raman microscopes that finds, classifies and identifies microparticles over even large sample areas.
User-defined categorization of particles by shape and size offers access to wide-ranging properties, and the results of the ParticleScout is an advanced particle analysis tool for witec360 Raman microscopes that finds, classifies and identifies microparticles over even large sample areas.
User-defined categorization of particles by shape and size offers access to wide-ranging properties, and the results of the measurement are then presented in a report that provides a comprehensive description of the sample.
ParticleScout features the most flexible and useful sample survey capabilities available.
- White-light Microscopy: Bright field/dark field, transmission/reflection.
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Image Stitching: Scans of many sample areas can be combined into one measurement for a large-area overview of widely distributed particles.
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Focus Stacking: This unique capability dramatically increases the depth of focus for sharp and defined particle imaging.
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Integration time optimisation – reduces measurement time and minimizes the effects of fluorescence.
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Vignetting correction – ensures uniform brightness throughout the image plane.
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Smart zoom – displays particle information dynamically depending on viewed area.
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Sample area targeting – allows the selection of multiple regions of interest for each investigation.
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Dark-field, bright-field, epifluorescence and transmission sample illumination – provides the best option for each type of particle.
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Round sample wedge sectioning – allows the selection of an area for data acquisition, typically on a filter, that can be extrapolated to represent the whole.
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Smart separation of particles – differentiates materials in densely packed, heterogeneous samples.
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• Quantitative report formatting – presents data using table, bar graph histogram and pie chart templates for ease and clarity.
... Read More | RISE Microscopy is a novel correlative microscopy technique that combines confocal Raman Imaging and SEM to link ultra-structural surface properties with molecular compound information.
The RISE Microscope combines all features of a stand-alone SEM and the witec360 confocal Raman imaging microscopeRISE Microscopy is a novel correlative microscopy technique that combines confocal Raman Imaging and SEM to link ultra-structural surface properties with molecular compound information.
The RISE Microscope combines all features of a stand-alone SEM and the witec360 confocal Raman imaging microscope within one instrument.
- Quick and convenient switching between Raman and SEM measurement.
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Automated sample transfer from one measuring position to the other.
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Integrated software interface for user-friendly measurement control.
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Correlation of the measurement results and image overlay.
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No compromise in SEM and Raman imaging capabilities.
... Read More | The patented TrueSurface Microscopy option for witec360 microscopes enables confocal Raman imaging guided by surface topography to maintain an optimal focus throughout a measurement.
The pioneering topographic Raman imaging technology uses an integrated optical profilometer to provide one-pass The patented TrueSurface Microscopy option for witec360 microscopes enables confocal Raman imaging guided by surface topography to maintain an optimal focus throughout a measurement.
The pioneering topographic Raman imaging technology uses an integrated optical profilometer to provide one-pass simultaneous operation.
- Enables 3D chemical characterisation of rough, inclined or irregularly shaped samples.
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• Compensates for variations during measurements with long integration times.
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• Features variable offset from the sample surface.
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• Integrates seamlessly with Raman, PL, white-light microscopy.
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• Further reduces sample preparation effort.
... Read More | The witec360 Semiconductor Edition is a high-end confocal Raman and photoluminescence (PL) microscope specifically configured for the chemical imaging of semiconducting materials. It helps researchers accelerate the characterisation of crystallinity, polymorphism, defects, strain and doping in theirThe witec360 Semiconductor Edition is a high-end confocal Raman and photoluminescence (PL) microscope specifically configured for the chemical imaging of semiconducting materials. It helps researchers accelerate the characterisation of crystallinity, polymorphism, defects, strain and doping in their semiconductor samples and wafers.
The microscope’s extended-range scanning stage enables the inspection of up to 12” (300 mm) wafers and the acquisition of large-area Raman images. It is equipped with vibration damping and active focus stabilization to compensate for topographic variation during measurements over large areas or long acquisition times. All microscope components are fully automated, permitting remote-control and the implementation of standard measurement procedures.
- Analysis of wide-bandgap semiconductors and layered structures.
- Surface analyses, depth scans and 3D imaging.
- Industry-leading confocal Raman and PL microscope for high speed, sensitivity and resolution – simultaneously.
- Scientific-grade, wavelength-optimised Hexalight spectrometer for high signal sensitivity and spectral resolution.
- Large-area scanning (300 x 350 mm) for wafer inspection.
- Active focus stabilization for large-area measurements (TrueSurface).
... Read More |
| Measurement Mode(s) | Confocal Raman Imaging Microscopy | Raman-based particle analysis | Raman Imaging-SEM | Topographic Raman Imaging | Confocal Raman Imaging Microscopy |
| Focal Length | Inquire | Inquire | Inquire | less than 1 µm | Inquire |
| Detector(s) | CCD/EMCCD | CCD/EMCCD | CCD/EMCCD | Optical Profilometer | CCD/EMCCD |
| Laser Sources | Multiple Laser Sources | Multiple Laser Sources | Multiple Laser Sources (up to six) | Multiple Laser Sources | Multiple Laser Sources |
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