In Raman microscopy, also called confocal Raman microscopy, an optical microscope and a Raman spectrometer are combined into one instrument in order to provide high resolution images of small samples. This high resolution imaging has applications that include materials science, earth science, cell biology, medicine, cosmetics, and art analysis.
A Raman microscope consists of a basic optical microscope, a Raman spectrometer, a laser, a light source, and a detector such as a CCD camera. The optical microscope uses light to magnify and identify samples while the Raman spectrometer scatters light and measures the excitation vibration. When selecting a microscope, it is important to consider the qualities of each of the microscope's components and their optimal configuration for a particular application.
Find, compare, and request a quote for Raman and confocal Raman microscopes across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
|  |  |  |  |  |
| Company | Bruker Optics | Bruker Optics | Bruker Optics | Bruker Optics | Bruker Optics |
| Item | RAMANdrive Wafer Analysis System | HYPERION Series Microscopes | RAMANtouch Confocal Laser Scanning Raman Microscope | RAMANwalk Confocal Raman Microscope | SENTERRA II Dispersive Raman Microscope |
| Citations | | | | | |
| Figures | | | | | |
| Reviews | | | | | |
| Catalog Number | | BOPT HYPERION 1000 / HYPERION 2000 / HYPERION 3000 | | | BOPT SENTERRA |
| Price | | | | | |
| Description | Inquire | The HYPERION II is an innovation force in infrared microscopy. It provides IR imaging down to the diffraction limit and sets the benchmark in ATR microscopy. It combines FT-IR and Infrared Laser Imaging (ILIM) microscopy for the first time ever in a single device, offering all three measurement The HYPERION II is an innovation force in infrared microscopy. It provides IR imaging down to the diffraction limit and sets the benchmark in ATR microscopy. It combines FT-IR and Infrared Laser Imaging (ILIM) microscopy for the first time ever in a single device, offering all three measurement modes: transmission, reflection, and ATR.
Features:
- Selection of detectors for µ-FT-IR: Broad-, mid, narrow-band LN2-MCTs, thermoelectrically cooled (TE) MCT.
- Focal-plane array detector for infrared imaging (64 x 64 or 128 x 128 pixel).
- Optional QCL implementation by Laser Infrared Imaging Module (ILIM, laser class 1)
- Objective lens selection: 3.5x/15x/36x IR, 20x ATR, 15x GIR, 4x/40x VIS.
- Spectral range extension – from Near-Infrared (NIR) to Far-Infrared (FIR)
- Selection of apertures: manual knife-edge, automated knife-edge aperture wheel. Metal apertures for NIR
- Selection of accessories and sample stages: macro IR imaging accessory, cooling/heating stage, sample compartment, etc.
- Selection of visual/optical tools: Darkfield illumination, Fluorescence illumination, VIS polarizers, IR polarizers, etc.
... Read More | Inquire | Inquire | The SENTERRA is a high performance Raman microscope spectrometer designed for the most demanding analytical and research applications. Its most important innovation is certainly its internal continuous calibration as it ensures highest wavenumber accuracy without the need for calibrations with The SENTERRA is a high performance Raman microscope spectrometer designed for the most demanding analytical and research applications. Its most important innovation is certainly its internal continuous calibration as it ensures highest wavenumber accuracy without the need for calibrations with external standards.
Features - Continuous calibration with Sure_Cal®
- Compact design with spectrometer included in the microscope
- Multiple wavelengths: 1064nm, 830nm, 785nm, 633nm, 532nm and 488nm
- High performance confocal depth profiling with FlexFocusTM
- Automatic Fluorescence Rejection (AFR) using SERDS
- Open architecture version for the study of larger samples (e.g. in art) with high lateral resolution
- Inverted version for the investigation of living cells
- Coupling with Atomic Force Microscopy (AFM)
Compact and Rugged Design Most commercial Raman microscopes employ spectrometers that are separate from the microscope. Therefore, alignment and maintenance of these devices is time consuming. SENTERRA integrates a multi-laser Raman spectrometer between the reflected light illuminator and the binocular of the microscope. SENTERRA’s compact design provides a short beam path, which increases sensitivity and makes it more robust and stable.... Read More |
| Measurement Mode(s) | Inquire | Inquire | Inquire | Inquire | Confocal Raman, Automatic Fluorescence |
| Focal Length | Inquire | Inquire | Inquire | Inquire | Inquire |
| Detector(s) | Inquire | Inquire | Inquire | Inquire | Grating |
| Laser Sources | Inquire | Inquire | Inquire | Inquire | Multiple laser sources |
| Get Quote | | | | | |