Description
The FTIR spectrometer ALPHA II combines outstanding quality with a small footprint and sets a benchmark in terms of user convenience. With the integrated panel PC and the touch-based operation, FTIR spectroscopy has never been easier.
Intuitive & Integrated
The ALPHA II features a new way to operate an FTIR spectrometer. With the integrated panel PC and the dedicated OPUS-TOUCH user interface it takes only three touches for measurement, evaluation and report generation. OPUS-TOUCH is very intuitive and guides you conveniently through the measurement and evaluation process.
Enhanced Performance
The ALPHA II represents the enhanced follow-up model of the very successful ALPHA spectrometer. Due to technical innovations such as advanced stabilization of source and detector it provides several improvements like higher sensitivity, higher spectral resolution, extended spectral range and higher robustness against changes in ambient temperature.
The ALPHA II includes a durable diode laser operated with patented technology to achieve a very high wavenumber accuracy. The well-proven RockSolidTM interferometer accomplishes consistent high-quality results with outstanding stability.
Efficiency in Routine Analysis
The ALPHA II offers all the capabilities needed for efficient routine analysis. It is ideally suited for quality control tasks like incoming goods inspection or the testing of intermediate and final products.
The identification of unkown samples as a common requirement in failure analysis, competition analysis, and forensics is extremly simple with the ALPHA II.
The ALPHA II is further very suitable for quantitative analysis providing optimal measurement conditions for all types of samples.
Design Follows Application
The QuickSnapTM sampling modules for the ALPHA II offer full sampling flexibility. They allow the analysis of almost any kind of sample (e.g. solids, liquids or gases) each with perfectly matched instrument configuration.
Multiple sampling accessories for transmission, attenuated total reflection (ATR), external and diffuse reflection are available to fulfill the requirements for many different analytical questions.