JSM-IT200 SEM InTouchScope™ Scanning Electron Microscope Series from JEOL USA, Inc.

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JEOL USA, Inc. for
JSM-IT200 SEM InTouchScope™ Scanning Electron Microscope Series

Description

Compact, versatile Scanning Electron Microscope that provides great value with high throughput, high-resolution imaging, and unsurpassed low kV performance. Analytical models include "Live View" of EDS spectra in real-time. Powerful software functionality, including automated image montaging, integrated management of image and analysis data, and automated report generation from all data ranging from collected SEM images to elemental analysis results.

Features
  • Zeromag – Simplifies Navigation and enhances throughput. Providing a seamless transition from an optical (or holder graphic) to SEM image
  • High throughput microanalysis with analytical models with full integration of EDS
  • High throughput microanalysis with analytical models with full integration of EDS
  • High throughput microanalysis with analytical models with full integration of EDS