Description
The HYPERION II is an innovation force in infrared microscopy. It provides IR imaging down to the diffraction limit and sets the benchmark in ATR microscopy. It combines FT-IR and Infrared Laser Imaging (ILIM) microscopy for the first time ever in a single device, offering all three measurement modes: transmission, reflection, and ATR.
Benefits:
- Perfect match of spectral and visual images. Applies to any measurement mode (including ATR imaging).
- Diffraction limited high sensitivity FT-IR microscopy and imaging by using focal plane array (FPA) detector.
- First ever combination of FT-IR and QCL technology by (optional) Infrared Laser Imaging Module (ILIM, laser class 1).
- Infrared laser imaging in all measurement modes (ATR, Transmission, Reflectance).
- Patented coherence reduction for artifact free Laser Imaging measurements without sensitivity or speed loss.
- High imaging speeds:
0.1 mm2per second (FPA, full spectrum)
6.4 mm2 per second (ILIM, single wavenumber)
- Optional TE-MCT detector to perform IR microscopy with high spatial resolution and sensitivity without liquid Nitrogen.
- Emission spectroscopy capability and optional spectral range extensions.
Features:
- Selection of detectors for µ-FT-IR:Broad-, mid, narrow-band LN2-MCTs,thermoelectrically cooled (TE) MCT.
- Focal-plane array detector for infrared imaging (64 x 64 or 128 x 128 pixel).
- Optional QCL implementation by Laser Infrared Imaging Module (ILIM, laser class 1)
- Objective lens selection: 3.5x/15x/36x IR,20x ATR, 15x GIR, 4x/40x VIS.
- Spectral range extension – from Near-Infrared (NIR) to Far-Infrared (FIR)
- Selection of apertures: manual knife-edge, automated knife-edge aperture wheel. Metal apertures for NIR
- Selection of accessories and sample stages: macro IR imaging accessory, cooling/heating stage, sample compartment, etc.
- Selection of visual/optical tools: Darkfield illumination, Fluorescence illumination, VIS polarizers, IR polarizers, etc.