Description
The HYPERION II is an innovation force in infrared microscopy. It provides IR imaging down to the diffraction limit and sets the benchmark in ATR microscopy. It combines FT-IR and Infrared Laser Imaging (ILIM) microscopy for the first time ever in a single device, offering all three measurement modes: transmission, reflection, and ATR.
Features:
- Selection of detectors for µ-FT-IR: Broad-, mid, narrow-band LN2-MCTs, thermoelectrically cooled (TE) MCT.
- Focal-plane array detector for infrared imaging (64 x 64 or 128 x 128 pixel).
- Optional QCL implementation by Laser Infrared Imaging Module (ILIM, laser class 1)
- Objective lens selection: 3.5x/15x/36x IR, 20x ATR, 15x GIR, 4x/40x VIS.
- Spectral range extension – from Near-Infrared (NIR) to Far-Infrared (FIR)
- Selection of apertures: manual knife-edge, automated knife-edge aperture wheel. Metal apertures for NIR
- Selection of accessories and sample stages: macro IR imaging accessory, cooling/heating stage, sample compartment, etc.
- Selection of visual/optical tools: Darkfield illumination, Fluorescence illumination, VIS polarizers, IR polarizers, etc.