Fourier transform infrared (FTIR) microscopes are used in conjunction with FTIR spectroscopy to allow visualization of a sample as an analysis of its components is being done. FTIR microscopes are used in manufacturing for quality control, failure analysis, and reverse engineering and is used in material, forensic, and environmental sciences for surface analysis. As the sample goes through the FTIR spectroscopy, it can be visualized using the microscope inside the spectrometer. The FTIR microscope allows analysis of much smaller samples than FTIR spectroscopy alone, but the sample size can still vary from one FTIR microscope to another. Others features that can differ include fully versus partially automatic and the ability to capture and store images or videos of the samples as the analysis occurs.
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| Company | Bruker Optics | Bruker Optics | Bruker Optics |
| Item | VERTEX Series FTIR Spectrometers | HYPERION Series Microscopes | LUMOS II FT-IR Microscope |
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| Catalog Number | VERTEX 80 / VERTEX 80v | BOPT HYPERION 1000 / HYPERION 2000 / HYPERION 3000 | Lumos II |
| Price | | | |
| Wavelength Range | 10 to 28,000 cm-1 (far IR or terahertz, mid, near IR, up to the visible or UV) | 80 to 25,000 cm-1 (far-IR to VIS) | Inquire |
| Signal-to-Noise Ratio | Inquire | Inquire | Inquire |
| Resolution | better than 0.2 cm-1 | 1.1 um to 2.7 um (HYPERION 3000) | Inquire |
| Description | When we set the bar for research FT-IR spectrometers, we knew that someday we would feel obliged to raise it. The new VERTEX Series is the culmination of everything Bruker Optics has pioneered and developed in over 30 years.
The VERTEX Series is built on a fully upgradeable optics platform that is When we set the bar for research FT-IR spectrometers, we knew that someday we would feel obliged to raise it. The new VERTEX Series is the culmination of everything Bruker Optics has pioneered and developed in over 30 years.
The VERTEX Series is built on a fully upgradeable optics platform that is designed with the utmost flexibility in mind. VERTEX spectrometers share a wide range of features, including the Bruker Artificial Intelligence Network (BRAIN), Automatic Component Recognition (ACR), the Plug & Play Ethernet connection and Automatic Accessory Recognition (AAR).
VERTEX 80/80v FT-IR Spectrometers
The VERTEX 80 and the VERTEX 80v vacuum FT-IR spectrometer is based on the actively aligned UltraScan™ interferometer, which provides PEAK spectral resolution. The precise linear air bearing scanner guarantees the ultimate sensitivity and stability.... Read More | The HYPERION II is an innovation force in infrared microscopy. It provides IR imaging down to the diffraction limit and sets the benchmark in ATR microscopy. It combines FT-IR and Infrared Laser Imaging (ILIM) microscopy for the first time ever in a single device, offering all three measurement The HYPERION II is an innovation force in infrared microscopy. It provides IR imaging down to the diffraction limit and sets the benchmark in ATR microscopy. It combines FT-IR and Infrared Laser Imaging (ILIM) microscopy for the first time ever in a single device, offering all three measurement modes: transmission, reflection, and ATR.
Features:
- Selection of detectors for µ-FT-IR: Broad-, mid, narrow-band LN2-MCTs, thermoelectrically cooled (TE) MCT.
- Focal-plane array detector for infrared imaging (64 x 64 or 128 x 128 pixel).
- Optional QCL implementation by Laser Infrared Imaging Module (ILIM, laser class 1)
- Objective lens selection: 3.5x/15x/36x IR, 20x ATR, 15x GIR, 4x/40x VIS.
- Spectral range extension – from Near-Infrared (NIR) to Far-Infrared (FIR)
- Selection of apertures: manual knife-edge, automated knife-edge aperture wheel. Metal apertures for NIR
- Selection of accessories and sample stages: macro IR imaging accessory, cooling/heating stage, sample compartment, etc.
- Selection of visual/optical tools: Darkfield illumination, Fluorescence illumination, VIS polarizers, IR polarizers, etc.
... Read More | The LUMOS II is a stand-alone FT-IR microscope that excels in failure analysis, material research and particle analysis. It is compact, precise and features ultrafast chemical imaging by FPA technology.
Features:
- Ease-of-use by software guided measurements
- High-definition spectral and visual data
The LUMOS II is a stand-alone FT-IR microscope that excels in failure analysis, material research and particle analysis. It is compact, precise and features ultrafast chemical imaging by FPA technology.
Features:
- Ease-of-use by software guided measurements
- High-definition spectral and visual data
- High IR sensitivity without liquid nitrogen
- Visual resolution in the sub micrometer range
- Ultrafast FPA imaging performance
- FPA imaging ATR/transmission/reflection
- Easy access to the sample stage
- Compliance to cGMP and FDA 21 CFR p11
- Automated OQ/PQ/pharmacopeia tests
- Anytime upgradeability
... Read More |
| Quantity | EA | EA | EA |
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