A spectrophotometer measures a material’s reflection or transmission by measuring light intensity/absorbency at a specific wavelength. UV-VIS and NIR spectrophotometers measure in those particular spectrums, with wavelength ranges that can span 135–3300 nm. Spectrophotometry is a top quantitative analysis method in fields such as chemistry, materials science, semiconductors, and forensic examination, and in clinical applications. When comparing UV-VIS/NIR spectrophotometers, take note of analysis speed, detection wavelength range, range of absorption, and stray light performance, especially with UV-VIS models.
Although both single-beam and double-beam instruments are available, the double-beam type measures the sample beam and reference beam simultaneously, upping ease of use, reproducibility, and light source and detector stability. Sensitivity in UV-VIS/NIR spectrophotometers can be enhanced through the use of multiple detectors.
Discover and compare UV VIS NIR Spectrophotometers:
|  |  |  |
| Company | Agilent Technologies | Agilent Technologies | Agilent Technologies |
| Item | Cary 5000 UV-Vis-NIR Spectrophotometer | Cary 6000i UV-Vis-NIR Spectrophotometer | Cary 7000 Universal Measurement Spectrophotometer (UMS) |
| Citations | | | |
| Reviews | | | |
| Catalog Number | 10079300 | 10079400 | Cary 7000 |
| Price | | | |
| Wavelength Range | 175 to 3300 nm | 175 to 1800 nm | 175 to 3300 nm |
| Spectral Bandwidth | Down to 0.01 nm | UV-Vis 0.01 - 5.00 nm; NIR 0.04 - 20 nm | UV-Vis 0.01 to 5.00 nm; NIR 0.04 to 20 nm |
| Resolution | Inquire | UV/Vis less than 0.05; NIR less than 0.1 | Inquire |
| Optical System | Double Beam | Double out-of-plane Littrow monochromator | Double out-of-plane Littrow monochromator |
| Wavelength Accuracy | Inquire | UV/vis +/- 0.1, NIR +/- 0.2 | UV-vis ± 0.08 nm,NIR ± 0.4 nm |
| Description | The Cary 5000 is a high-performance UV-Vis and NIR spectrophotometer with superb photometric performance in the 175–3300 nm range. Using a PbSmart detector, the Cary 5000 extends its NIR range to 3300 nm making it a powerful tool for materials science research. The Cary WinUV software, a modular The Cary 5000 is a high-performance UV-Vis and NIR spectrophotometer with superb photometric performance in the 175–3300 nm range. Using a PbSmart detector, the Cary 5000 extends its NIR range to 3300 nm making it a powerful tool for materials science research. The Cary WinUV software, a modular Windows-based software, makes it easy to perform powerful analysis and control a number of optional accessories.
The large sample compartment can be expanded to hold large accessories and integrating spheres for spectral and diffuse reflectance. The LockDown mechanism makes it possible to quickly change and position accessories for reproducible results.
Features - Measure beyond 8.0 absorbance units with reference beam attenuation
- Measure 175 to 3300 nm using a PbSmart NIR detector for extended photometric range
- WinUV software—modular software with power analysis and enhanced transfer and report export capabilities
- Versatile set of accessories for materials research including spectral and diffuse reflectance
- Variable slit widths (down to 0.01 nm) for optimum control over data resolution
- Large sample compartment with LockDown mechanism for quick changes and positioning for reproducible results
- Maximum light throughput using Schwarzchild coupling optics for higher accuracy at low transmission levels
- Minimal noise and stray light using a floating aluminum casting and double Littrow monochromator
- Extended dynamic range by attenuating the reference beam to balance double beam signal levels.
- Nitrogen purging—separate purging in the sample and monochromator compartments to reduce oxygen and water vapor in the ultra-violet.
... Read More | The Cary 6000i UV-Vis-NIR spectrophotometer has been tailored for unmatched photometric performance in the short-wave infrared (SWIR) 800–1800 nm range as well as the UV-visible 175 to 800 nm. Using narrow-band InGaAs detection and a 600 lines-per-mm diffaction grating for improved SWIR sensivity, The Cary 6000i UV-Vis-NIR spectrophotometer has been tailored for unmatched photometric performance in the short-wave infrared (SWIR) 800–1800 nm range as well as the UV-visible 175 to 800 nm. Using narrow-band InGaAs detection and a 600 lines-per-mm diffaction grating for improved SWIR sensivity, the Cary 6000i is the ultimate tool for materials characterization spectroscopy.
Using Cary WinUV software with the Cary 6000i makes it easy to perform powerful analysis and control optional accessories. The large sample compartment can be expanded to hold large accessories and integrating spheres for spectral and diffuse reflectance. The LockDown mechanism makes it possible to quickly change and position accessories for reproducible results.
Features
- Measure beyond 8.0 absorbance units with reference beam attenuation
- Measure 175 to 1800 nm using a narrow-band InGaAs detector and 600 l/mm NIR diffraction gratings for unmatched sensivity in the short-wave infrared
- WinUV software—modular software with power analysis and enhanced transfer and report export capabilities
- Versatile set of accessories for materials research including spectral and diffuse reflectance
- Variable slit widths (down to 0.01 nm) for optimum control over data resolution
- Large sample compartment with LockDown mechanism for quick changes and positioning for reproducible results
- Maximum light throughput using Schwarzchild coupling optics for higher accuracy at low transmission levels
- Minimal noise and stray light using a floating aluminum casting and double out-of-plane Littrow monochromator
- Extended dynamic range by attenuating the reference beam to balance double beam signal levels.
- Nitrogen purging—separate purging in the sample and monochromator compartments to reduce oxygen and water vapor in the ultra-violet.
... Read More | The Agilent Cary 7000 universal measurement spectrophotometer (UMS) will satisfy all your solid sampling needs. Collect hundreds of UV-Vis-NIR spectra overnight or characterize optical components and thin films in minutes to hours rather than hours to days. The Cary 7000 UMS is a turn-key solution The Agilent Cary 7000 universal measurement spectrophotometer (UMS) will satisfy all your solid sampling needs. Collect hundreds of UV-Vis-NIR spectra overnight or characterize optical components and thin films in minutes to hours rather than hours to days. The Cary 7000 UMS is a turn-key solution for research, development, and QA/QC in optics, thin films/coatings, solar, and glass.
The Cary 7000 instrument's multiangle specular reflectance and transmittance capabilities allow you to design experiments never before possible—expanding your research—while the automated reflectance and transmission will save you time and money.
Features
- Achieve complete sample characterization
- Measure absolute reflection and transmission in a single sequence—at variable angle and s or p polarization—without moving or disturbing the sample.
- Measure diffusely scattered transmission and reflection with the freedom to control detector and sample position independently
- Utilize the huge sample chamber to accommodate all sample types—from small to large—delivering 360 degrees of rotational flexibility
- Obtain complete control of beam collimation and patch size to best suit your sample and measurement needs
- Lower your cost-per-analysis, saving you time and money
- Measure in minutes what other systems take hours to days to complete—with unattended automation
- Simply set up your method, collect a single baseline, insert one or more samples, and walk away
- New insights into advanced materials with an unprecedented 10 Abs range
- With 10 Abs range on the Cary 7000 spectrophotometer, the Cary 7000 UMS ensures you obtain high quality results even with challenging sample measurements, such as high optical density (OD) or under difficult measurement conditions
- Obtain the highest quality results fast with the next generation Cary WinUV software
- The Cary WinUV software features a new method editor for simple method setup, advanced data processing, and 3D graphics, ensuring fast and accurate data analysis
... Read More |
| Get Quote | | | |