X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
Find, compare, and request a quote for X-ray diffractometers (XRD instruments) across leading suppliers at Labcompare; including access to product citations, related published figures, and first-hand reviews from our scientific community.
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Company | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation | Rigaku Corporation |
Item | SmartLab High-Resolution Diffraction System | AutoMATE II | SmartLab SE X-ray Diffractometer | XtaLAB Synergy-DW Versatile Dual Wavelength X-ray Diffractometer with HPC X-ray Detector |
Citations | | | | |
Catalog Number | SmartLab | | SmartLab SE | XtaLAB Synergy-DW |
Price | | | | |
X-Ray Tube | 3 kW sealed X-ray tube | Cr (Maximum load 2 kW), Effective focus size 1 × 10 mm2 (N.F.), Short type | 3 kW sealed X-ray tube | Inquire |
X-Ray Generator | 9.0 kW Rotating Anode Generator | 3 kW sealed X-ray tube | Inquire | Dual wavelength X-ray source |
Goniometer Type | High Resolution Theta/Theta Closed Loop | two-axis goniometer | Inquire | kappa goniometer |
Detector(s) | D/teX Ultra 250 silicon strip detector | D/teX Ultra 1000 | HyPix-400 2D, D/teX Ultra 250 1D | HPC detector |
Description | The SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fullyThe SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fully automated optical system to make advanced measurements possible for both expert and novice users of the system.
Winner of the 2006 R&D 100 Award for technical innovation, the SmartLab is design for completely automated analysis of thin films and other advanced materials. Powered by Guidance, Rigaku's revolutionary knowledge based software package, SmartLab uses fully deveopled measurement packages for completely automated measurement of thin films, nanomaterials, powders, and liquids. Measurement packages exist for powder diffraction, glancing incidence diffraction, in-plane diffraction, X-ray reflectivity, and small angle X-ray scattering (SAXS) measurements.
Features
- Θ/Θ design for horizontal sample mounting
- Closed loop drive system for high resolution scanning
- Optional 9.0 kW rotating anode generator
- Fully automatic system alignment
- Guidance software based automated measurement
- 300 mm wafer handling
- CBO for focusing and parallel beam geometries without reconfiguration
- In-plane diffraction arm for in-plane measurements without reconfiguration
- High resolution optics
- SAXS capabilities
... Read More | The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and perform scans with minimum steps of 0.1 microns when using the automated XYZ stage.
Features:
- Highly accurate goniometer allows for true micro-area residual stress measurement.
- Automatic mapping measurements with teaching function.
- An X-ray radiation enclosure with interlock system automatically locks the enclosure door when the X-ray shutter is open.
- The measurement position is adjusted by _x000B_a CCD camera equipped with a microscope having a zoom function.
- The two-axis goniometer system allows for both iso-inclination _x000B_and side-inclination methods automatically without readjustment of the sample position.
... Read More | The SmartLab SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross The SmartLab SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and advanced photon counting hybrid pixel array detectors (HPAD).
Features:
- SmartLab Studio II software based on a new architecturally integrated modular platform
- Cross-beam optics module switches between Bragg-Brentano and parallel beam without the need to change optics.
- HyPix-400 2D detector enables seamless switch between 0D, 1D and 2D detection mode depending on application type.
- D/teX Ultra 250 1D detector accelerates powder diffraction by a factor of 250 in speed and provides adjustable energy resolution of approximately 20% or 4% depending on
sample type.
- Integrated intelligent Guidance software enables fully automated measurement including optics and sample alignment.
- Self-aligned optics maximize instrument uptime and minimize cost of ownership.
... Read More | One source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wideOne source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide range of research interests.
The XtaLAB Synergy-DW diffractometer is based on the proven, low-maintenance MicroMax-007 HF microfocus rotating anode. The target is constructed with two different X-ray source materials (Cu and Mo) and is coupled with an auto-switching dual wavelength optic. Copper or molybdenum X-ray radiation is available at the click of a button. The XtaLAB Synergy-DW offers up to 12x higher flux compared to the standard sealed tube X-ray sources and, utilizing only one generator, means overall maintenance is reduced.
Rounding out the XtaLAB Synergy-DW configuration is the fast and efficient four-circle kappa goniometer which is compatible with a wide range of detectors including the HyPix-6000HE and other Hybrid Photon Counting (HPC) X-ray detectors e.g. PILATUS and EIGER detectors.
Features:
- TAccess to two wavelengths in one compact system
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12x higher flux than sealed tube X-ray sources
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Low maintenance, high performance system
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Uses CrysAlisPro software with both PX and SMX modes
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Multi-functional diffractometer to cover you wherever your research takes you
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High flux performance means you all your crystallography needs can be carried out ‘in-house’
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Very little downtime and easy maintenance
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No need to purchase extra software for different applications
... Read More |
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