| Description | The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.
The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and perform scans with minimum steps of 0.1 microns when using the automated XYZ stage.
Features:
- Highly accurate goniometer allows for true micro-area residual stress measurement.
- Automatic mapping measurements with teaching function.
- An X-ray radiation enclosure with interlock system automatically locks the enclosure door when the X-ray shutter is open.
- The measurement position is adjusted by _x000B_a CCD camera equipped with a microscope having a zoom function.
- The two-axis goniometer system allows for both iso-inclination _x000B_and side-inclination methods automatically without readjustment of the sample position.
... Read More | New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview:
- New 6th generation design
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Compact, fail-safe radiation enclosure
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Incident beam variable slit
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Simple installation and user training
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Factory aligned goniometer system
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Laptop computer operation
Measurements:
- Phase identification
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Phase quantification
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Percent (%) crystallinity
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Crystallite size and strain
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Lattice parameter refinement
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Rietveld refinement
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Molecular structure
Options:
- 8-position autosampler
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Graphite monochromator
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D/teX Ultra: silicon strip detector
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HyPix-400 MF: 2D HPAD detector
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Air sensitive sample holder
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Travel case
... Read More | The SmartLab SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross The SmartLab SE is a highly versatile multipurpose X-ray diffractometer with built-in intelligent guidance. It offers continued refinement of the original ease of use features that enabled the original SmartLab to receive the R&D 100 Award in 2006: automatic alignment, component recognition, cross beam optics and advanced photon counting hybrid pixel array detectors (HPAD).
Features:
- SmartLab Studio II software based on a new architecturally integrated modular platform
- Cross-beam optics module switches between Bragg-Brentano and parallel beam without the need to change optics.
- HyPix-400 2D detector enables seamless switch between 0D, 1D and 2D detection mode depending on application type.
- D/teX Ultra 250 1D detector accelerates powder diffraction by a factor of 250 in speed and provides adjustable energy resolution of approximately 20% or 4% depending on
sample type.
- Integrated intelligent Guidance software enables fully automated measurement including optics and sample alignment.
- Self-aligned optics maximize instrument uptime and minimize cost of ownership.
... Read More | The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and nanocrcrystals as small as tens of nanometers, opening up many new possibilities. This new capability allows you to go beyond the limitations of X-ray diffraction (XRD), which requires samples greater them 1 µm.
- Directly determine 3D molecular structures of submicron crystals for the first time
- Rigaku’s high-speed, high-sensitivity photon counting detector - HyPix-ED
- JEOL’s expertise in generation and control of stable electron beams – 200 kV electron source and optics
- Rigaku’s powerful single crystal analysis software – CrysAlisPro-ED
3DED/microED is an excellent complementary technique to XRD, and the compact design of the XtaLAB Synergy-ED allows it to be easily located in laboratories alongside these instruments. Crystallographers familiar with Rigaku diffractometers running CrysAlisPRO will be able to adapt to the CrysAlisPRO-ED interface very quickly, as it is based on the same intuitive platform.
The fully integrated system incorporates a seamless workflow from data collection to structure determination of three-dimensional molecular structures. AutoChem, which is fully integrated into CrysAlisPRO, performs fast, fully automated structure solution and refinement during data collection, optimizing your productivity.
3DED/microED allows direct structural determination of sub-micron sized crystals that could only previously be postulated by techniques such as NMR. As an emerging technique, there is scope for the generation of many publications using the XtaLAB Synergy-ED.
... Read More | The XtaLAB Synergy-i single crystal X-ray diffractometer includes a high-flux, low maintenance microfocus sealed tube X-ray instrument with a high precision 4-circle kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector known as the HyPix-Bantam. The XtaLAB Synergy-i containsThe XtaLAB Synergy-i single crystal X-ray diffractometer includes a high-flux, low maintenance microfocus sealed tube X-ray instrument with a high precision 4-circle kappa goniometer and Rigaku’s own Hybrid Photon Counting (HPC) X-ray detector known as the HyPix-Bantam. The XtaLAB Synergy-i contains the latest technology and can be upgraded from a single source to a dual source instrument. The system can be equipped with Cu and/or Mo sources allowing for a broad range of sample types to be evaluated. The XtaLAB Synergy-i is controlled by the fully-integrated, user-inspired CrysAlisPro software package that is capable of collecting and processing data efficiently and accurately, so you achieve the best data possible.
The XtaLAB Synergy-i is a full-featured single crystal X-ray diffractometer that requires little servicing to maximize uptime and throughput. It is the ideal diffractometer for crystallography research laboratories.
Features:
- Up to 50 W microfocus X-ray tube with multilayer optics
- High precision 4-circle kappa goniometer
- State-of-the-art HPC technology detector, the HyPix-Bantam
- New cabinet design with controlled sample and cabinet lighting
- The system conforms to the most stringent of X-ray safety guidelines
- CrysAlisPro: Powerful, user-friendly software, comes standard with AutoChem3.0 for fully-automated structure solution and refinement
- Simple dual-source upgrade
... Read More |