| Description | With the 3rd generation Empyrean, Malvern Panalytical has now redefined the concept of a multipurpose diffractometer: our newly designed MultiCore Optics enable the largest variety of measurements without any manual intervention. Empyrean has the unique ability to measure all sample types - from With the 3rd generation Empyrean, Malvern Panalytical has now redefined the concept of a multipurpose diffractometer: our newly designed MultiCore Optics enable the largest variety of measurements without any manual intervention. Empyrean has the unique ability to measure all sample types - from powders to thin films, from nanomaterials to solid objects - on a single instrument. The world of materials science is constantly changing and the life of a high performance diffractometer is much longer than the typical horizon of any research project. With Empyrean, you are ready for anything the future holds.
Empyrean is the only platform that does it all, delivering the best data quality on every sample types. It covers the largest set of X-ray diffraction, scattering and imaging applications in one single instrument. Moreover, Empyrean not only meets the high expectations of scientists and XRD experts today, but will continue to do so as research themes evolve Empyrean is ideal for teaching purposes, thanks to the large doors that open completely, allowing access to the system to several people; but at the same time is perfect to perform measurements in demanding R&D environments in several industries.
Features: - Highest data quality on every sample
- Multipurpose and future proof
- Hybrid PIXel technologies
- MultiCore Optics
- PreFIX
- Good laboratory practice
- Customized solutions for X-ray diffraction
... Read More | Prepare to be surprised by our highly accurate, fast XRD system: Aeris.
Precise results can be ready in less than five minutes – allowing you to push
the scientific frontier. The compact Aeris is small, powerful, and the first of its
kind.
This compact instrument is smaller and easier to use Prepare to be surprised by our highly accurate, fast XRD system: Aeris.
Precise results can be ready in less than five minutes – allowing you to push
the scientific frontier. The compact Aeris is small, powerful, and the first of its
kind.
This compact instrument is smaller and easier to use than floorstanding equipment and bigger and
more powerful than benchtop systems. Aeris is just right. It delivers the precision, robustness, and
efficiency that our customers know and love – providing outstanding quality with all the convenience
of a smaller footprint.
Take the one-step sample loading in combination with its controlled user
access and the option to design data collection programs offline, the result is
a practical and versatile system for all users, from beginners to experts.
Features:
- It is intuitive - Place your sample, choose a measurement program, receive your results
- It has best-in-class performance - Superior resolution and linearity for accurate and reliable
phase analysis
- It is the ideal teaching tool - With the optional 2D detector you can teach the fundamentals
of powder diffraction in a visual manner
- It can measure phase transitions - With the optional non-ambient chamber you can see
how the phase composition changes with temperature
Product Detail
- Item: Aeris Research Compact X-Ray Diffractometer
... Read More | Quick and precise crystal orientation measurement has never been so accessible – meet the SDCOM, your user-friendly compact XRD. The azimuthal scan method unlocks ultra-fast measurement, with results returned in under five seconds.
SDCOM delivers the highest level of precision of up to 0.01o, Quick and precise crystal orientation measurement has never been so accessible – meet the SDCOM, your user-friendly compact XRD. The azimuthal scan method unlocks ultra-fast measurement, with results returned in under five seconds.
SDCOM delivers the highest level of precision of up to 0.01o, and with a wide variety of sample holders and transfer fixtures including a marking option for lateral crystal direction, this easy-to-use compact is the ideal solution for many applications within wafer processing and research.
Features and Benefits
- Ultra-fast and precise: azimuthal scan method
The azimuthal scan method requires only one measuring circle to gather all the necessary data to fully determine the orientation, which delivers high precision at a very low measuring time – in the range of a few seconds.
The sample is rotated 360o, with the X-ray source and detector positioned to achieve a certain number of reflections per turn. These reflections enable the orientation of the crystal lattice to be measured in relation to the rotation axis with high precision in a short period of time.
- Compact and versatile
SDCOM is lightweight and compact, making it easily movable and able to fit easily into your process – whether in research or industry. The XRD Suite software is both powerful and intuitive, making it convenient and easy to operate for a range of users.
Flexibility is key to the SDCOM, which is especially clear in the range of materials it can measure. The SDCOM can measure crystals starting from 1 mm in size, and examples of measurable materials include:
-Cubic, arbitrary unknown orientation: Si, Ge, GaAs, GaP, InP
-Cubic, special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, SiC3C, PbS, PbTe, SnTe, MgO, LiF, MgAl2O4, SrTiO3, LaTiO3
-Tetragonal: MgF2, TiO2, SrLaAlO4
-Hexagonal and trigonal: SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO3, SiO2 (quartz), Al2O3 (sapphire), GaPO4, La3Ga5SiO14
-Orthorhombic: Mg2SiO4, NdGaO3
There is also a variety of sample holders and transfer fixtures that can further expand the possibilities of your SDCOM’s applications, ensuring compatibility with your workflow. Manual and motorized wafer mapping stages are also available.
- User-friendly precision
SDCOM delivers excellent precision of up to 0.01o depending on the sample, and is able to measure crystals ranging from 1 mm and upwards in size. This precision is maintained at the highest speeds thanks to the azimuthal scan method, which provides full characterization of crystal orientation within a single measuring rotation. There is also an option to include a lateral crystal direction marking function.
Thanks to manual handling and intuitive software design, the SDCOM is easy to use and accessible for a range of user types – practical in both research and industry, where user experience levels may vary.
- Cost-effective
SDCOM’s X-ray tube is air-cooled, eliminating the need for water cooling. Thanks to the SDCOM’s efficiency and small footprint, its energy consumption is kept to a minimum – and so are your running costs.
... Read More | Meet the Wafer XRD 300: your high-speed X-ray diffraction module for 300mm wafer production providing key data on a variety of essential parameters such as crystal orientation and geometric features like notches, flats, and much more – designed to fit seamlessly into your process line.
Features Meet the Wafer XRD 300: your high-speed X-ray diffraction module for 300mm wafer production providing key data on a variety of essential parameters such as crystal orientation and geometric features like notches, flats, and much more – designed to fit seamlessly into your process line.
Features and Benefits
- Ultra-fast precision with our proprietary scan technology
The used method requires only one rotational scan to gather all the necessary data to fully determine the crystal orientation, which delivers high precision at a very low measuring time – in the range of a few seconds.
- Fully automated handling and sorting
Wafer XRD 300 is designed to maximize your throughput and productivity. Full integration into your handling and sorting automation makes it a powerful and efficient addition to your process.
- Easy connectivity
Wafer XRD 300’s powerful automation fits easily into your new or existing process, as it is compatible with both MES and SECS/GEM interfaces.
- High precision, deeper insight
Understand your materials like never before with Wafer XRD 300’s key measurements including:
-Crystal orientation
-Notch position, depth, and opening angle
-Diameter
-Flat position and length
-Further sensors available on request
The typical standard deviation tilt (example: Si 100) for the Azimuthal-scan is <0.003o.
- Powerful and versatile
As semiconductor research evolves, it has never been more important to measure a variety of samples. Wafer XRD 300 makes analysis easy and fast for hundreds of materials, including:
-Si
-SiC
-AlN
-Al2O3 (sapphire)
-GaAs
-Quartz
-LiNbO3
-BBO
... Read More | The X’Pert3 MRD-XL Materials Research Diffractometer is the system of choice for high resolution diffraction and scattering analysis of wafers up to 300mm in diameter. It handles a wide variety of X-ray scattering methods, including high resolution diffraction, in-plane diffraction, reflectivity, The X’Pert3 MRD-XL Materials Research Diffractometer is the system of choice for high resolution diffraction and scattering analysis of wafers up to 300mm in diameter. It handles a wide variety of X-ray scattering methods, including high resolution diffraction, in-plane diffraction, reflectivity, thin film phase analysis, wafer mapping, GISAXS, stress, texture and nonambient analysis. The X’Pert3 MRD features the highest resolution goniometer with Heidenhain encoders for lightening fast positioning, a 5 axis cradle allowing for support and mapping of wafers up to 6 inches in diameter, and a wide variety of advanced optics and detectors, including the PIXcel3D for fast reciprocal space mapping. The X’Pert3 MRD-XL also offers a sophisticated, automatic wafer loader option that enables the X'Pert3 MRD XL to function as an 'in-wall' system, with the wafer being loaded from a clean room environment and placed on to a self-centered wafer holder.... Read More |