X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.
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Company | Rigaku Americas Corporation | Rigaku Americas Corporation | Rigaku Americas Corporation | Rigaku Americas Corporation |
Item | XtaLAB mini™ II Benchtop X-ray Diffraction/Crystallography System | MiniFlex Benchtop X-ray Diffractometer | XtaLAB Synergy-DW Versatile Dual Wavelength X-ray Diffractometer with HPC X-ray Detector | XtaLAB Synergy-ED – Electron Diffractometer |
Citations | | | | |
Catalog Number | XtaLAB mini II | MiniFlex | XtaLAB Synergy-DW | XtaLAB Synergy-ED |
Price | | | | |
X-Ray Tube | standard X-ray tubes | Inquire | Inquire | Inquire |
X-Ray Generator | Standard sealed tube X-ray source running at 600 W coupled to a special curved monochromator to produce usable X-ray flux comparable to a standard X-ray diffractometer | Cu, Co, Fe, or Cr, 40 kV, 15 mA | Dual wavelength X-ray source | Inquire |
Goniometer Type | Rugged two-axis goniometer with fixed detector | Vertical, Theta or 2Theta | kappa goniometer | Single rotation axis |
Detector(s) | HyPix-Bantam two-dimensional semiconductor X-ray detector | D/teX, Ultra 1D High speed silicon strip detector | HPC detector | High-speed, high-sensitivity photon-counting detector, HyPix-ED |
Description | Benchtop small molecule structure determination
The Rigaku XtaLAB mini II benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II Benchtop small molecule structure determination
The Rigaku XtaLAB mini II benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II will enhance research productivity by offering affordable structure analysis capability without the necessity of relying on a departmental facility. With the XtaLAB mini II, you no longer have to wait in line to determine your structures. Instead your research group can rapidly analyze new compounds as they are synthesized in the lab.
Teach diffraction through hands-on experience -
In many universities, the departmental X-ray diffractometer is considered off limits to students because of fear that the instrument might be damaged by inexperienced users. The XtaLAB mini II provides the opportunity for students to learn single crystal analysis by actually using a diffractometer. This is not a black box instrument. Rather, the important step of mounting a crystal on the goniometer and physically centering the crystal in the position of the X-ray beam, ensures that students learn the importance of mounting techniques and crystal selection. The simple design of the XtaLAB mini II minimizes the danger of students damaging the system.
Reduced size does not mean reduced data quality -
The Rigaku XtaLAB mini II is a research grade chemical crystallography instrument that sits on the benchtop. No data quality compromises, no extended collection times. Results delivered are unambiguous. X-ray tube lifetime is extended by running at 600 W. To compensate for running at a lower power, a SHINE optic (special curved monochromator) is utilized to produce usable X-ray flux comparable to a standard X-ray system.
Dedicated to producing publication quality structures -
The chief design requirement when creating the XtaLAB mini II was that the structures produced would be publishable in the most demanding scientific journals. The HPC detector is positioned so that the maximum 2θ value is well outside of the Acta Cryst. requirements. The software provides all the tools you need to generate publication quality data that can be used to determine 3D structures from a variety of structure analysis packages.
Features:
- Affordable design with low operating costs
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Requires minimal training and support
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Automatic structure solution software
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Provides definitive structural information
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Ideal supplement for a NMR spectrometer
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Perfect self-serve departmental lab instrument
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Ideal teaching instrument
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Publication quality results
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Air-cooled HPC detector
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No special infrastructure required (110 VAC)
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Optional cryosystem available
... Read More | New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
Overview:
- New 6th generation design
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Compact, fail-safe radiation enclosure
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Incident beam variable slit
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Simple installation and user training
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Factory aligned goniometer system
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Laptop computer operation
Measurements:
- Phase identification
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Phase quantification
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Percent (%) crystallinity
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Crystallite size and strain
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Lattice parameter refinement
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Rietveld refinement
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Molecular structure
Options:
- 8-position autosampler
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Graphite monochromator
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D/teX Ultra: silicon strip detector
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HyPix-400 MF: 2D HPAD detector
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Air sensitive sample holder
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Travel case
... Read More | One source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wideOne source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide range of research interests.
The XtaLAB Synergy-DW diffractometer is based on the proven, low-maintenance MicroMax-007 HF microfocus rotating anode. The target is constructed with two different X-ray source materials (Cu and Mo) and is coupled with an auto-switching dual wavelength optic. Copper or molybdenum X-ray radiation is available at the click of a button. The XtaLAB Synergy-DW offers up to 12x higher flux compared to the standard sealed tube X-ray sources and, utilizing only one generator, means overall maintenance is reduced.
Rounding out the XtaLAB Synergy-DW configuration is the fast and efficient four-circle kappa goniometer which is compatible with a wide range of detectors including the HyPix-6000HE and other Hybrid Photon Counting (HPC) X-ray detectors e.g. PILATUS and EIGER detectors.
Features:
- TAccess to two wavelengths in one compact system
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12x higher flux than sealed tube X-ray sources
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Low maintenance, high performance system
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Uses CrysAlisPro software with both PX and SMX modes
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Multi-functional diffractometer to cover you wherever your research takes you
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High flux performance means you all your crystallography needs can be carried out ‘in-house’
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Very little downtime and easy maintenance
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No need to purchase extra software for different applications
... Read More | The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and The XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and nanocrcrystals as small as tens of nanometers, opening up many new possibilities. This new capability allows you to go beyond the limitations of X-ray diffraction (XRD), which requires samples greater them 1 µm.
- Directly determine 3D molecular structures of submicron crystals for the first time
- Rigaku’s high-speed, high-sensitivity photon counting detector - HyPix-ED
- JEOL’s expertise in generation and control of stable electron beams – 200 kV electron source and optics
- Rigaku’s powerful single crystal analysis software – CrysAlisPro-ED
3DED/microED is an excellent complementary technique to XRD, and the compact design of the XtaLAB Synergy-ED allows it to be easily located in laboratories alongside these instruments. Crystallographers familiar with Rigaku diffractometers running CrysAlisPRO will be able to adapt to the CrysAlisPRO-ED interface very quickly, as it is based on the same intuitive platform.
The fully integrated system incorporates a seamless workflow from data collection to structure determination of three-dimensional molecular structures. AutoChem, which is fully integrated into CrysAlisPRO, performs fast, fully automated structure solution and refinement during data collection, optimizing your productivity.
3DED/microED allows direct structural determination of sub-micron sized crystals that could only previously be postulated by techniques such as NMR. As an emerging technique, there is scope for the generation of many publications using the XtaLAB Synergy-ED. ... Read More |
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