X-Ray Diffractometer (XRD Instruments)

X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.

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CompanyRigaku Americas CorporationRigaku Americas CorporationRigaku Americas CorporationRigaku Americas Corporation
ItemXtaLAB mini™ II Benchtop X-ray Diffraction/Crystallography SystemMiniFlex Benchtop X-ray DiffractometerXtaLAB Synergy-DW Versatile Dual Wavelength X-ray Diffractometer with HPC X-ray DetectorXtaLAB Synergy-ED – Electron Diffractometer
Citations
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Catalog NumberXtaLAB mini IIMiniFlexXtaLAB Synergy-DWXtaLAB Synergy-ED
Price
X-Ray Tubestandard X-ray tubesInquireInquireInquire
X-Ray GeneratorStandard sealed tube X-ray source running at 600 W coupled to a special curved monochromator to produce usable X-ray flux comparable to a standard X-ray diffractometerCu, Co, Fe, or Cr, 40 kV, 15 mADual wavelength X-ray sourceInquire
Goniometer TypeRugged two-axis goniometer with fixed detectorVertical, Theta or 2Thetakappa goniometerSingle rotation axis
Detector(s)HyPix-Bantam two-dimensional semiconductor X-ray detectorD/teX, Ultra 1D High speed silicon strip detectorHPC detectorHigh-speed, high-sensitivity photon-counting detector, HyPix-ED
DescriptionBenchtop small molecule structure determination

The Rigaku XtaLAB mini II benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II
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New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is ... Read MoreOne source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide... Read MoreThe XtaLAB Synergy-ED is the world’s first 3DED/microED (3D Electron Diffraction/micro Electron Diffraction) system and the successful culmination of a joint development project between Rigaku and JEOL. 3DED/microED allows crystallographers to probe the structure of crystals and ... Read More
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