X-Ray Diffractometer (XRD Instruments)

X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.

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CompanyRigaku Americas CorporationRigaku Americas CorporationRigaku Americas CorporationRigaku Americas CorporationRigaku Americas Corporation
ItemXtaLAB mini™ II Benchtop X-ray Diffraction/Crystallography SystemMiniFlex Benchtop X-ray DiffractometerMiniflex XpC XRDSmartLab High-Resolution Diffraction SystemXtaLAB Synergy-DW Versatile Dual Wavelength X-ray Diffractometer with HPC X-ray Detector
Citations
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Catalog NumberXtaLAB mini IIMiniFlexMiniFlex XpCSmartLabXtaLAB Synergy-DW
Price
X-Ray Tubestandard X-ray tubesInquire600 W3 kW sealed X-ray tubeInquire
X-Ray GeneratorStandard sealed tube X-ray source running at 600 W coupled to a special curved monochromator to produce usable X-ray flux comparable to a standard X-ray diffractometerCu, Co, Fe, or Cr, 40 kV, 15 mACompact 800 W generator and compact X-ray tube9.0 kW Rotating Anode GeneratorDual wavelength X-ray source
Goniometer TypeRugged two-axis goniometer with fixed detectorVertical, Theta or 2ThetaΘ-Θ sample horizontal goniometerHigh Resolution Theta/Theta Closed Loopkappa goniometer
Detector(s)HyPix-Bantam two-dimensional semiconductor X-ray detectorD/teX, Ultra 1D High speed silicon strip detectorD/teX Ultra silicon stripD/teX Ultra 250 silicon strip detectorHPC detector
DescriptionBenchtop small molecule structure determination

The Rigaku XtaLAB mini II benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II
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New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is ... Read MoreThe Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing ... Read MoreThe SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fully... Read MoreOne source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide... Read More
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