X-Ray Diffractometer (XRD Instruments)

X-ray diffraction (XRD) allows one to ascertain the molecular structure of a crystalline material by diffracting X-rays through the sample. An XRD analyzer obtains interference patterns reflecting lattice structures by varying the angle of incidence of the X-ray beam. Thus, the precision, speed of rotation, and beam size of the X-rays become important parameters by which to judge products. Benchtop XRD can be targeted for single crystal diffraction for imaging lattices; powder diffraction for phase determination; identifying unfamiliar substances for use in inspection, crystallography, and pharmaceutical research correlating crystal structures with drug efficacy. X-ray generators can reach 18 KW in power and detectors typically come as compound silicon arrays, Peltier-Cooled, Silicon Drift, or Scintillation Counter variants. Software targeted for specific XRD applications is available for upgrade in some analyzer models.

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CompanyRigaku Americas CorporationRigaku Americas CorporationRigaku Americas CorporationRigaku Americas CorporationRigaku Americas Corporation
ItemXtaLAB mini™ II Benchtop X-ray Diffraction/Crystallography SystemAutoMATE IIMiniflex XpC XRDXtaLAB Synergy CustomXtaLAB Synergy-DW Versatile Dual Wavelength X-ray Diffractometer with HPC X-ray Detector
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Catalog NumberXtaLAB mini IIMiniFlex XpCXtaLABXtaLAB Synergy-DW
Price
X-Ray Tubestandard X-ray tubesCr (Maximum load 2 kW), Effective focus size 1 × 10 mm2 (N.F.), Short type600 WInquireInquire
X-Ray GeneratorStandard sealed tube X-ray source running at 600 W coupled to a special curved monochromator to produce usable X-ray flux comparable to a standard X-ray diffractometer3 kW sealed X-ray tubeCompact 800 W generator and compact X-ray tubeMicroMax-007 HF microfocus rotating anode source or the highest-flux in-house X-ray source, the FR-X (Mo, Cu, or Cr).Dual wavelength X-ray source
Goniometer TypeRugged two-axis goniometer with fixed detectortwo-axis goniometerΘ-Θ sample horizontal goniometerFast kappa geometry goniometerkappa goniometer
Detector(s)HyPix-Bantam two-dimensional semiconductor X-ray detectorD/teX Ultra 1000D/teX Ultra silicon stripHyPix-6000HE, the large theta coverage HyPix-Arc 150° or the Dectris EIGER 4M.HPC detector
DescriptionBenchtop small molecule structure determination

The Rigaku XtaLAB mini II benchtop X-ray crystallography system, is a compact single crystal X-ray diffractometer designed to produce publication-quality 3D structures. The perfect addition to any synthetic chemistry laboratory, the XtaLAB mini II
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The AutoMATE II can measure large and heavy parts (30 kg with standard manual Z stage; 20 kg with optional automated XYZ stage) with high accuracy.

The X-ray source and detector arm are mounted on a highly accurate two-axis goniometer that can position them relative to the measurement site and
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The Miniflex XpC is an X-ray diffractometer designed specifically for quality control in cement plants and other operations requiring online process control such as pharmaceuticals and batteries. It has been optimized for speed and accuracy, bringing lab-quality performance to the manufacturing ... Read MoreCustomized Single Crystal Diffraction System With Microfocus Rotating Anode Generator

Features:
  • Ultimate flexibility with customized X-ray system specifically tailored to the needs of your research. Dual ports allow for various combinations of crystallography and SAXS configurations. Your choice
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One source with two high-flux wavelengths is the foundation of the revolutionary XtaLAB Synergy-DW single crystal X-ray diffractometer. It combines the increased flux of a rotating anode X-ray source with the flexibility of two different wavelengths, making it ideal for laboratories exploring a wide... Read More
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