X-ray fluorescence spectrometers use high-energy X-rays or gamma rays to excite fluorescent radiation (or photons) from a sample for chemical or elemental analysis. In an energy dispersive X-ray fluorescence spectrometer (EDXRF Spectrometer), the fluorescent photons from the irradiated sample are detected without being separated first (as they are in wavelength dispersive XRF spectrometers). Therefore, EDXRF spectrometers typically have better efficiency, whereas WDXRF spectrometers have better resolution. Energy Dispersive XRF Spectrometers are used to analyze solid samples and although they have broad applications as disparate as petrochemical analysis, food safety, and plastics, one of the main attractions of this technique is that it is non-destructive, which makes it very attractive for analysis of samples that are irreplaceable, such as artifacts from an archeological site. The limit of detection for EDXRF spectrometers is typically in the parts per million (ppm) range.
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| Company | Malvern Panalytical | Malvern Panalytical |
| Item | Zetium WDXRF, EDXRF and XRD Spectrometer for Elemental Analysis | Epsilon Xline EDXRF |
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| Catalog Number | Zetium | Epsilon Xline |
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| Element Range | Multi-element | Able to measure all valuable elements of interest, including platinum and cerium |
| Sample Type | Solids and Liquids | Coating line |
| X-Ray Tube | Rh, Cr, Mo and Au | Ag |
| Detector(s) | HiPer scintillation detector | High-resolution Si drift detector SDD10 |
| Sample Chamber | 6 mm and 37 mm (sample size) | Inquire |
| Description | The Zetium spectrometer delivers reliable analytical performance regardless of the application and is ideally suited to the analysis of a wide range of materials. Building on years of experience and success with our extensive analytical X-ray portfolio, Zetium represents a revolutionary step in The Zetium spectrometer delivers reliable analytical performance regardless of the application and is ideally suited to the analysis of a wide range of materials. Building on years of experience and success with our extensive analytical X-ray portfolio, Zetium represents a revolutionary step in materials analysis. The platform embodies SumXcore technology – an integration of WDXRF, EDXRF and XRD. This unique combination of possibilities puts Zetium in a class of its own with respect to analytical power, speed and task flexibility in multiple environments.
Industry editions of the Zetium XRF spectrometer are offered with dedicated expertise templates, and hardware and software configurations for specific industries. Designed for rapid commissioning and calibration, these industry editions have proprietary, high-quality, traceable application setup modules, that include setup standards and sample preparation instructions. Also included are tailored application templates for typical industry applications and international norms compliance. Among the industries served with this approach are cement, minerals, metals, petrochemicals and polymers & plastics. The Ultimate edition configuration meets the most demanding requirements regardless of industry.... Read More | In-line control for continuous roll-to-roll processes
Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis In-line control for continuous roll-to-roll processes
Epsilon Xline combines our advanced energy dispersive XRF (EDXRF) technology with in-line functionality. This advanced solution enables real-time materials monitoring and process control in roll-to-roll (R2R) coating processes. Direct analysis allows continuous optimization of material composition?and loading, helping to minimize off-specification production and maximize cost-efficiency. The adaptable Epsilon Xline can deliver precise and accurate process control across a wide range of surfaces and elements.
Features:
- Full in-line automation. Enjoy continuous R2R production thanks to the Epsilon Xline’s seamless integration capabilities, suitable for a range of thin-film and coating applications.
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Simple and safe. The Epsilon Xline is fully X-ray safe and easy to use, unlike handheld or legacy instruments, and delivers highly accurate analytical data.
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A lifetime of experience. Drawing on Malvern Panalytical’s more than 70 years’ experience in elemental analysis, the Epsilon Xline was developed in collaboration with our industry partners to meet their needs of today – and at the same time looking to the industry’s future together.
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Maximized yield. Achieve cost-competitive production with real-time monitoring and no disruption – giving you the direct insights and control you need to get the most out of your operations.
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Optimum materials efficiency. Eliminate inconsistencies, avoid wasting precious materials, and ensure a high-quality product with our industry-standard solution.
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Proven, patented accuracy. Developed and tested with customers, the Epsilon Xline features patented height-correction technology that ensures stable analysis for accurate results.
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